Summary Abstract: Structure factors of two‐dimensional lattice gases: Theoretical investigation of some aspects of the capability of low‐energy electron diffraction to measure critical phenomena of surface phase transitions

1987 ◽  
Vol 5 (4) ◽  
pp. 647-648
Author(s):  
T. L. Einstein ◽  
N. C. Bartelt ◽  
L. D. Roelofs
Keyword(s):  
Low Energy ◽  
Lattice Gases ◽  
Two Dimensional ◽  
Surface Phase ◽  
Dimensional Lattice ◽  
Low Energy Electron Diffraction ◽  
Structure Factors ◽  
Surface Phase Transitions ◽  
Low Energy Electron ◽  
Abstract Structure

Low Energy Electron Microscopy of Surface Processes on Clean Si(111) and Si (100)

1989 ◽  
Vol 159 ◽  
Author(s):  
E. Bauer ◽  
M. Mundschau ◽  
W. Swiech ◽  
W. Telieps
Keyword(s):  
Electron Microscopy ◽  
Phase Transitions ◽  
Crystal Growth ◽  
Surface Defects ◽  
Low Energy ◽  
Energy Electron ◽  
Surface Processes ◽  
Surface Phase ◽  
Surface Phase Transitions ◽  
Low Energy Electron

ABSTRACTLow energy electron microscopy (LEEM) is briefly introduced and its application to the study of surface defects, surface phase transitions on Si(111), crystal growth and sublimation on Si(100) is illustrated.

Theory of Low-Energy Electron Diffraction

1967 ◽  
Vol 22 (3) ◽  
pp. 322-330 ◽  
Author(s):  
Kyozaburo Kambe
Keyword(s):  
Integral Equation ◽  
Electron Diffraction ◽  
Low Energy ◽  
Energy Electron ◽  
Two Dimensional ◽  
Band Theory ◽  
Low Energy Electron Diffraction ◽  
Diffracted Waves ◽  
Low Energy Electron ◽  
Cellular Method

A method for calculating the intensities of diffracted waves in low energy electron diffraction by crystals is proposed. The elastic multiple scattering is fully taken into account. The cellular method of KOHN and ROSTOKER in the band theory of metals is applied to the integral equation of the scattering by two dimensional lattices, particularly by monatomic layers. The solution is expanded in spherical harmonics on the surface of spheres, within which the atomic potential is assumed to be confined.

Structure of Epitaxial CoSi2 Films on Si(111) Studied with Low-Energy Electron Diffraction (LEED)

1998 ◽  
Vol 05 (01) ◽  
pp. 139-144 ◽  
Author(s):  
U. Starke ◽  
J. Schardt ◽  
W. Weiß ◽  
G. Rangelov ◽  
Th. Fauster ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Lattice Mismatch ◽  
Vertical Direction ◽  
Low Energy ◽  
Energy Electron ◽  
Surface Phase ◽  
Lateral Direction ◽  
Rich Phase ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron

Expitaxial films of CoSi 2 on Si(111) were investigated by low-energy electron diffraction. Films of approximately 12 Å thickness were prepared by simultaneous deposition of Co and Si and subsequent annealing. The films were found to crystallize in CaF 2 structure in (111) orientation. Two (1×1) phases of different stoichiometry exist. The surface phase that contains more Co is found to be a CoSi 2(111) bulklike structure terminated by a Si–Co–Si trilayer. The Si-rich phase is terminated by an additional nonrotated silicon bilayer with the lower silicon atoms bound to cobalt in the first CoSi 2 layer. Consequently, these cobalt atoms have an eightfold coordination. Due to the lattice mismatch the silicide films are expanded by 0.5% in the lateral direction and contracted by 1.4% in the vertical direction.

Scanning Low-Energy Electron Diffraction Microscopy Combined with Scanning Tunnling Microscopy

1990 ◽  
Vol 48 (1) ◽  
pp. 302-303
Author(s):  
Takeo Ichinokawa
Keyword(s):  
Electron Diffraction ◽  
Electron Energy ◽  
High Vacuum ◽  
Low Energy ◽  
Energy Electron ◽  
Scanning Tunneling ◽  
Two Dimensional ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron ◽  
Auger Microscopy

A ultra-high vacuum scanning electron microscope (UHV-SEM) with a field emission gun (FEG) has been operated in an energy range of from 100 eV to 3 keV. A new technique of scanning low energy electron diffraction (LEED) microscopy has been added to the other techniques: scanning Auger microscopy (SAM), secondary electron microscopy, electron energy loss microscopy and the others available for the UHV-SEM. In addition to scanning LEED microscopy, a scanning tunneling microscope (STM) has been installed in the UHV-SEM-.The combination of STM with SEM covers a wide magnification range from 105 to 107 and is very effective for observation of surface structures with a high resolution of about 1 Å.A UHV-FEG-SEM is equipped in a chamber in which the vacuum is better than 2×10-10 Torr. A movable cylindrical mirror analyzer (CMA), a two dimensional detector of diffracted LEED beams, an ion gun and a deposition source are installed in this chamber. The concept of the scanning LEED microscope is comprised of two steps: (1) the formation of a selected area LEED pattern and (2) the generation of raster images with information contained in the diffraction pattern. In the present experiment, the LEED detector assembly shown in Fig.l has been used; it consists of two hemisherical grids, a two-stage channel-plate amplifier and a position-sensitive detector. The selection of one (or more) diffracted beam is performed electronically by a window using the two-dimensional analogue comparators. The intensity of a particular beam selected by the window modulates the brightness of the scanning image and a dark field image sensitive to the surface structure is formed. The experimental spatial resolutions of 150 Å and 500 Å have been attained at the primary electron energy 1 keV and 250 eV, respectively.

Study of Sodium Adsorption on Pb/Si(111) Surfaces

2018 ◽  
Vol 386 ◽  
pp. 55-60
Author(s):  
Maria Valeryevna Ryzhkova ◽  
Dmitry Anatolyevich Tsukanov ◽  
Elena Anatolyevna Borisenko ◽  
Maxim Viktorovich Ivanchenko
Keyword(s):  
Phase Diagram ◽  
Alloy Layer ◽  
Surface Conductivity ◽  
Low Energy ◽  
Surface Structures ◽  
Two Dimensional ◽  
Ordered Structure ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron

The new reconstructions formed by sodium adsorption on Pb-terminated Si (111) surface were obtained: 2x2+2sqrt3x2sqrt3, 4x1, 3x3 and others. These surface structures have been observed by low-energy electron diffraction (LEED) and phase diagram for 2D binary (Na,Pb)/Si (111) system has been obtained. The (Na,Pb)/Si (111) system is considered as a two-dimensional alloy layer with highly ordered structure. Influence of two-dimensional alloys on surface conductivity of Si (111) substrate has been studied in situ by four-point-probe method.

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