Summary Abstract: The importance of multiple scattering in x‐ray photoelectron and Auger electron diffraction in crystals

1987 ◽  
Vol 5 (4) ◽  
pp. 1684-1684 ◽  
Author(s):  
W. F. Egelhoff
Keyword(s):  
Electron Diffraction ◽  
Multiple Scattering ◽  
Auger Electron ◽  
X Ray

scholarly journals Disentangling atomic-layer-specific x-ray absorption spectra by Auger electron diffraction spectroscopy

2009 ◽  
Vol 190 ◽  
pp. 012111
Author(s):  
Fumihiko Matsui ◽  
Tomohiro Matsushita ◽  
Yukako Kato ◽  
Mie Hashimoto ◽  
Hiroshi Daimon
Keyword(s):  
Electron Diffraction ◽  
Absorption Spectra ◽  
Auger Electron ◽  
Atomic Layer ◽  
X Ray ◽  
X Ray Absorption

The Ge Stranski-Krastanov growth mode on Si(01)(2 x 1) tested by X-ray photoelectron and Auger electron diffraction

1993 ◽  
Vol 291 (1-2) ◽  
pp. A565
Author(s):  
M. Diani ◽  
D. Aubel ◽  
J.L. Bischoff ◽  
L. Kubler ◽  
D. Bolmont
Keyword(s):  
Electron Diffraction ◽  
Auger Electron ◽  
Growth Mode ◽  
X Ray

MEASUREMENTS OF AUGER ELECTRON DIFFRACTION USING A 180° DEFLECTION TOROIDAL ANALYZER

1999 ◽  
Vol 06 (05) ◽  
pp. 585-590 ◽  
Author(s):  
SUSUMU SHIRAKI ◽  
HIDESHI ISHII ◽  
YOSHIMASA NIHEI ◽  
MASANORI OWARI
Keyword(s):  
Electron Beam ◽  
Electron Diffraction ◽  
Multiple Scattering ◽  
Auger Electron ◽  
Theoretical Data ◽  
Two Dimensional ◽  
Electron Spectrometer ◽  
Simultaneous Registration ◽  
Wide Range ◽  
Good For

A 180° deflection toroidal analyzer is a novel electron spectrometer, which allows the simultaneous registration of the wide range of polar angles in a given azimuth of the sample. Therefore, measurements of photo- and Auger electron intensities over π steradians can be performed rapidly by azimuthal rotation of the sample. Using this analyzer, two-dimensional patterns of electron-beam-excited O KVV and Mg KVV Auger electron diffraction (AED) from a MgO(001) surface were measured in short acquisition times. The AED patterns obtained were compared with theoretical ones calculated by the multiple-scattering scheme. The agreement between experimental and theoretical data was good for both O KVV and Mg KVV transitions.

Monolayer-resolved x-ray-excited Auger-electron diffraction from single-plane emission in GaAs

1993 ◽  
Vol 48 (16) ◽  
pp. 11838-11845 ◽  
Author(s):  
M. Seelmann-Eggebert ◽  
R. Fasel ◽  
E. C. Larkins ◽  
J. Osterwalder
Keyword(s):  
Electron Diffraction ◽  
Auger Electron ◽  
Single Plane ◽  
X Ray
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