Role of multiple scattering in x-ray photoelectron spectroscopy and Auger-electron diffraction in crystals

William F. Egelhoff

doi:10.1103/physrevlett.59.559

Role of multiple scattering in x-ray photoelectron spectroscopy and Auger-electron diffraction in crystals

Physical Review Letters ◽

10.1103/physrevlett.59.559 ◽

1987 ◽

Vol 59 (5) ◽

pp. 559-562 ◽

Cited By ~ 108

Author(s):

William F. Egelhoff

Keyword(s):

Electron Diffraction ◽

Multiple Scattering ◽

Photoelectron Spectroscopy ◽

Auger Electron ◽

X Ray

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Role of Multiple Scattering in X-Ray-Photoelectron and Auger-Electron Diffraction in Crystals

Physical Review Letters ◽

10.1103/physrevlett.59.1492.5 ◽

1987 ◽

Vol 59 (13) ◽

pp. 1492-1492 ◽

Cited By ~ 1

Author(s):

William F. Egelhoff

Keyword(s):

Electron Diffraction ◽

Multiple Scattering ◽

Auger Electron ◽

X Ray

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Direct observation of LaB6(001) surface at high temperatures by x‐ray and ultraviolet photoelectron spectroscopy, low‐energy electron diffraction, Auger electron spectroscopy, and work‐function measurements

Journal of Applied Physics ◽

10.1063/1.326542 ◽

1979 ◽

Vol 50 (7) ◽

pp. 4802-4807 ◽

Cited By ~ 28

Author(s):

M. Aono ◽

R. Nishitani ◽

C. Oshima ◽

T. Tanaka ◽

E. Bannai ◽

...

Keyword(s):

Electron Diffraction ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Low Energy ◽

Ultraviolet Photoelectron Spectroscopy ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Summary Abstract: The importance of multiple scattering in x‐ray photoelectron and Auger electron diffraction in crystals

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.574547 ◽

1987 ◽

Vol 5 (4) ◽

pp. 1684-1684 ◽

Cited By ~ 4

Author(s):

W. F. Egelhoff

Keyword(s):

Electron Diffraction ◽

Multiple Scattering ◽

Auger Electron ◽

X Ray

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The effect of Sr and Bi on the Si(100) surface oxidation: Auger electron spectroscopy, low energy electron diffraction, and x‐ray photoelectron spectroscopy study

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.576438 ◽

1990 ◽

Vol 8 (6) ◽

pp. 4017-4020 ◽

Cited By ~ 9

Author(s):

W. C. Fan ◽

A. Mesarwi ◽

A. Ignatiev

Keyword(s):

Electron Diffraction ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Oxidation ◽

Low Energy ◽

Spectroscopy Study ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Low-Energy Electron Diffraction, X-ray Photoelectron Spectroscopy, and Auger Electron Spectroscopy

ACS Symposium Series - Electrochemical Surface Science ◽

10.1021/bk-1988-0378.ch010 ◽

1988 ◽

pp. 141-153 ◽

Cited By ~ 1

Author(s):

Michael E. Hanson ◽

Ernest Yeager

Keyword(s):

Electron Diffraction ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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H2S‐treated GaP(001) surface studied by low‐energy electron diffraction, Auger electron spectroscopy, and x‐ray photoelectron spectroscopy

Applied Physics Letters ◽

10.1063/1.107740 ◽

1992 ◽

Vol 61 (8) ◽

pp. 955-957 ◽

Cited By ~ 14

Author(s):

Y. Fukuda ◽

N. Sanada ◽

M. Kuroda ◽

Y. Suzuki

Keyword(s):

Electron Diffraction ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser

10.3403/30124424 ◽

2005 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Resolution Analysis ◽

Surface Chemical Analysis

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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results

10.3403/30242215 ◽

2011 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Surface Chemical Analysis

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Study of amorphous and crystallised Fe75B25 by Auger electron spectroscopy and X-ray photoelectron spectroscopy

Applied Surface Science ◽

10.1016/0169-4332(91)90396-2 ◽

1991 ◽

Vol 51 (3-4) ◽

pp. 139-155 ◽

Cited By ~ 19

Author(s):

S.K. Sharma ◽

S. Hofmann

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray

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International Standardization of Quantitative Surface Analysis by Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

Shinku ◽

10.3131/jvsj.48.261 ◽

2005 ◽

Vol 48 (4) ◽

pp. 261-264

Author(s):

Shigeo TANUMA

Keyword(s):

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Quantitative Surface Analysis ◽

International Standardization

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