A simple high‐pressure reaction chamber connected to an ultrahigh vacuum system for surface studies

1987 ◽  
Vol 5 (2) ◽  
pp. 234-236 ◽  
Author(s):  
P. Bracconi ◽  
E. Pörschke ◽  
K. H. Klatt ◽  
R. Lässer
Keyword(s):  
High Pressure ◽  
Ultrahigh Vacuum ◽  
Reaction Chamber ◽  
Vacuum System ◽  
Surface Studies ◽  
High Pressure Reaction

scholarly journals Ultrahigh vacuum high-pressure reaction system for 2-infrared 1-visible sum frequency generation studies

2001 ◽  
Vol 72 (3) ◽  
pp. 1806 ◽  
Author(s):  
K. Y. Kung ◽  
P. Chen ◽  
F. Wei ◽  
G. Rupprechter ◽  
Y. R. Shen ◽  
...  
Keyword(s):  
High Pressure ◽  
Reaction System ◽  
Ultrahigh Vacuum ◽  
Sum Frequency Generation ◽  
Sum Frequency ◽  
Frequency Generation ◽  
High Pressure Reaction

Analytical Electron Microscope Evacuated by Perfect Dry Pumping System

1981 ◽  
Vol 39 ◽  
pp. 376-377
Author(s):  
Y. Harada ◽  
Y. Ishida ◽  
Y. Arai ◽  
K. Ooi ◽  
Y. Obara
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Ultrahigh Vacuum ◽  
Diffraction Method ◽  
High Energy ◽  
Vacuum System ◽  
Ion Pump ◽  
Surface Studies ◽  
Analytical Electron ◽  
Analytical Electron Microscope

Analytical electron microscopes (AEM), which provide the functions of transmission electron microscopy, scanning electron microscopy, energy dispersive X-ray spectroscopy and electron energy loss spectroscopy, have been in practical use to analyze elements in microareas. Meanwhile, surface studies have recently been conducted with an ultrahigh vacuum (UHV) electron microscope by utilizing reflection electron microscopy including the reflection high energy electron diffraction method. We have developed an ultrahigh vacuum analytical electron microscope (UHVAEM) aimed at surface studies.The present paper describes the outstanding features of the UHVAEM. Fig. 1 shows the schematic diagram of its vacuum system. The specimen and gun chambers are evacuated by a sputter ion pump (SIP) after being rough pumped by a turbo molecular pump (TMP). The viewing and camera chambers which have much out-gas from photographic films are evacuated by the TMP. The image forming lens system is designed to provide constant projector lens excitation over the entire magnification range.

Ultrahigh‐vacuum system for surface studies using high‐energy ion scattering and x‐ray photoemission spectroscopy

1987 ◽  
Vol 58 (12) ◽  
pp. 2284-2287 ◽  
Author(s):  
R. J. Smith ◽  
C. N. Whang ◽  
Xu Mingde ◽  
M. Worthington ◽  
C. Hennessy ◽  
...  
Keyword(s):  
Ultrahigh Vacuum ◽  
High Energy ◽  
Vacuum System ◽  
Photoemission Spectroscopy ◽  
Ion Scattering ◽  
Surface Studies ◽  
X Ray
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