Variable angle x‐ray photoelectron spectroscopy and ion scattering spectroscopy study of the Ag/SiO2 interface

1986 ◽  
Vol 4 (3) ◽  
pp. 1653-1657 ◽  
Author(s):  
J. R. Pitts ◽  
T. M. Thomas ◽  
A. W. Czanderna
2016 ◽  
Vol 18 (36) ◽  
pp. 25230-25240 ◽  
Author(s):  
László Óvári ◽  
András Berkó ◽  
Gábor Vári ◽  
Richárd Gubó ◽  
Arnold Péter Farkas ◽  
...  

Scanning tunnelling microscopy (STM), low energy ion scattering spectroscopy (LEIS), X-ray photoelectron spectroscopy (XPS) and high resolution electron energy loss spectroscopy (HREELS) were applied for studying Au deposited on the Rh(111) surface.


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