Local structure of silicon films and silicon carbide by surface extended energy loss fine structure

1985 ◽  
Vol 3 (3) ◽  
pp. 1309-1311 ◽  
Author(s):  
C. Natarajan ◽  
P. B. Abel ◽  
R. W. Hoffman
Keyword(s):  
Silicon Carbide ◽  
Fine Structure ◽  
Energy Loss ◽  
Local Structure ◽  
Silicon Films

Surface electron-energy-loss fine-structure investigation on the local structure of copper clusters on graphite

1987 ◽  
Vol 35 (12) ◽  
pp. 5997-6003 ◽  
Author(s):  
M. De Crescenzi ◽  
M. Diociaiuti ◽  
L. Lozzi ◽  
P. Picozzi ◽  
S. Santucci
Keyword(s):  
Fine Structure ◽  
Energy Loss ◽  
Electron Energy ◽  
Local Structure ◽  
Structure Investigation ◽  
Surface Electron ◽  
Copper Clusters ◽  
Electron Energy Loss

Local structure determination of the CoSi(111) interface by surface electron energy-loss fine-structure technique

1986 ◽  
Vol 168 (1-3) ◽  
pp. 801-809 ◽  
Author(s):  
E. Chaînet ◽  
M. De Crescenzi ◽  
J. Derrien ◽  
T.T.A. Nguyen ◽  
R.C. Cinti
Keyword(s):  
Fine Structure ◽  
Energy Loss ◽  
Electron Energy ◽  
Structure Determination ◽  
Local Structure ◽  
Surface Electron ◽  
Electron Energy Loss

Some Aspects of Exelfs Analysis in the Electron Microscope

1980 ◽  
Vol 38 ◽  
pp. 118-119
Author(s):  
D. E. Johnson ◽  
S. Csillag
Keyword(s):  
Fine Structure ◽  
Electron Microscope ◽  
Energy Loss ◽  
Analytical Electron Microscopy ◽  
Interference Effects ◽  
Interatomic Distances ◽  
X Ray ◽  
Structure Information ◽  
Microanalytical Technique ◽  
Analytical Electron

Recently, the applications area of analytical electron microscopy has been extended to include the study of Extended Energy Loss Fine Structure (EXELFS). Modulations past an ionization edge in the energy loss spectrum (EXELFS), contain atomic fine structure information similar to Extended X-ray Absorbtion Fine Structure (EXAFS). At low momentum transfer the main contribution to these modulations comes from interference effects between the outgoing excited inner shell electron waves and electron waves backscattered from the surrounding atoms. The ability to obtain atomic fine structure information (such as interatomic distances) combined with the spatial resolution of an electron microscope is unique and makes EXELFS an important microanalytical technique.

scholarly journals Local Structure and Dynamics of Functional Materials Studied by X-ray Absorption Fine Structure

Symmetry ◽  
2021 ◽  
Vol 13 (8) ◽  
pp. 1315
Author(s):  
Takafumi Miyanaga
Keyword(s):  
Fine Structure ◽  
Local Structure ◽  
Chemical Reactivity ◽  
Functional Materials ◽  
X Ray ◽  
Structure And Dynamics ◽  
Absorption Fine ◽  
Structure Phase Transition ◽  
Local Electronic Structure ◽  
X Ray Absorption

X-ray absorption fine structure (XAFS) is a powerful technique used to analyze a local electronic structure, local atomic structure, and structural dynamics. In this review, I present examples of XAFS that apply to the local structure and dynamics of functional materials: (1) structure phase transition in perovskite PbTiO3 and magnetic FeRhPd alloys; (2) nano-scaled fluctuations related to their magnetic properties in Ni–Mn alloys and Fe/Cr thin films; and (3) the Debye–Waller factors related to the chemical reactivity for catalysis in polyanions and ligand exchange reaction. This study shows that the local structure and dynamics are related to the characteristic function of the materials.

Sign in / Sign up

Export Citation Format

Share Document