Local atomic and electronic structure of oxide/GaAs and SiO2/Si interfaces using high‐resolution XPS
1979 ◽
Vol 16
(5)
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pp. 1443-1453
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2011 ◽
Vol 23
(26)
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pp. 265503
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1999 ◽
Vol 83
(21)
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pp. 4409-4412
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1990 ◽
Vol 117-118
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pp. 18-26
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