Local atomic and electronic structure of oxide/GaAs and SiO2/Si interfaces using high‐resolution XPS

1979 ◽  
Vol 16 (5) ◽  
pp. 1443-1453 ◽  
Author(s):  
F. J. Grunthaner ◽  
P. J. Grunthaner ◽  
R. P. Vasquez ◽  
B. F. Lewis ◽  
J. Maserjian ◽  
...  
RSC Advances ◽  
2016 ◽  
Vol 6 (100) ◽  
pp. 98001-98009 ◽  
Author(s):  
Thais Chagas ◽  
Thiago H. R. Cunha ◽  
Matheus J. S. Matos ◽  
Diogo D. dos Reis ◽  
Karolline A. S. Araujo ◽  
...  

We have used atomically-resolved scanning tunneling microscopy and spectroscopy to study the interplay between the atomic and electronic structure of graphene formed on copper via chemical vapor deposition.


2011 ◽  
Vol 23 (26) ◽  
pp. 265503 ◽  
Author(s):  
J Vegelius ◽  
I L Soroka ◽  
P T Korelis ◽  
B Hjörvarsson ◽  
S M Butorin

2014 ◽  
Vol 89 (8) ◽  
Author(s):  
C. Tournier-Colletta ◽  
G. Autès ◽  
B. Kierren ◽  
Ph. Bugnon ◽  
H. Berger ◽  
...  

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