Effects of various bias and temperature stresses on low-frequency noise properties of amorphous InGaZnO thin-film transistors

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Hee-Joong Kim ◽  
Chan-Yong Jeong ◽  
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Hyuck-In Kwon
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Forough Mahmoudabadi ◽  
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Jong In Kim ◽  
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Sun Il Kim ◽  
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