Asymmetrical degradation behaviors in amorphous InGaZnO thin-film transistors under various gate and drain bias stresses

2015 ◽  
Vol 33 (1) ◽  
pp. 011202 ◽  
Author(s):  
Daeun Lee ◽  
Chan-Yong Jeong ◽  
Sang-Hun Song ◽  
Jin Xiao-Shi ◽  
Jong In Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Drain Bias ◽  
Degradation Behaviors ◽  
Amorphous Ingazno

Local-Degradation-Induced Threshold Voltage Shift in Turned-OFF Amorphous InGaZnO Thin Film Transistors Under AC Drain Bias Stress

2015 ◽  
Vol 36 (6) ◽  
pp. 579-581 ◽  
Author(s):  
Jong In Kim ◽  
In-Tak Cho ◽  
Chan-Yong Jeong ◽  
Daeun Lee ◽  
Hyuck-In Kwon ◽  
...  
Keyword(s):  
Thin Film ◽  
Threshold Voltage ◽  
Thin Film Transistors ◽  
Threshold Voltage Shift ◽  
Voltage Shift ◽  
Bias Stress ◽  
Drain Bias ◽  
Amorphous Ingazno

Thermal Effect on the Gate-Drain Bias Stress for Amorphous InGaZnO Thin Film Transistors

2012 ◽  
Vol 15 (5) ◽  
pp. H161 ◽  
Author(s):  
Sheng-Yao Huang ◽  
Ting-Chang Chang ◽  
Min-Chen Chen ◽  
Shih-Cheng Chen ◽  
Te-Chih Chen ◽  
...  
Keyword(s):  
Thin Film ◽  
Thermal Effect ◽  
Thin Film Transistors ◽  
Bias Stress ◽  
Drain Bias ◽  
Amorphous Ingazno

Drain Bias Effect on the Instability of Amorphous InGaZnO Thin-Film Transistors under Negative Gate Bias and Illumination Stress

2014 ◽  
Vol 64 (10) ◽  
pp. 65-70
Author(s):  
D. Wang ◽  
M. P. Hung ◽  
J. Jiang ◽  
T. Toda ◽  
M. Furuta
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Gate Bias ◽  
Bias Effect ◽  
Drain Bias ◽  
Amorphous Ingazno

Effect of drain bias on negative gate bias and illumination stress induced degradation in amorphous InGaZnO thin-film transistors

2014 ◽  
Vol 53 (3S1) ◽  
pp. 03CC01 ◽  
Author(s):  
Dapeng Wang ◽  
Mai Phi Hung ◽  
Jingxin Jiang ◽  
Tatsuya Toda ◽  
Chaoyang Li ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Gate Bias ◽  
Drain Bias ◽  
Amorphous Ingazno
Sign in / Sign up

Export Citation Format

Share Document