Probe field enhancement in photonic crystals by upconversion nanoparticles

Author(s):  
Jingyu Zhang ◽  
Teresa E. Pick ◽  
Daniel Gargas ◽  
Scott Dhuey ◽  
Emory M. Chan ◽  
...  
2009 ◽  
Vol 17 (24) ◽  
pp. 22179 ◽  
Author(s):  
Hari P. Paudel ◽  
Khadijeh Bayat ◽  
Mahdi Farrokh Baroughi ◽  
Stanley May ◽  
David W. Galipeau

2019 ◽  
Vol 30 (50) ◽  
pp. 505706
Author(s):  
Hanbing Zhang ◽  
Linlin Xu ◽  
Fenchao Liu ◽  
Chao Huang ◽  
Jie Wei

2018 ◽  
Vol 3 (6) ◽  
pp. 616-623 ◽  
Author(s):  
Baoqi Liu ◽  
Zhipeng Meng ◽  
Suli Wu ◽  
Yue Wu ◽  
Shufen Zhang

Rational control of the multiple emission outputs and achieving single-band and strong luminescence of Ln3+ doped upconversion nanoparticles is highly desirable for their applications in sensor and display fields.


2001 ◽  
Vol 8 (3) ◽  
pp. 217 ◽  
Author(s):  
Ovidiu Toader ◽  
Sajeev John ◽  
Kurt Busch

Author(s):  
C. Barth ◽  
K. Jäger ◽  
S. Burger ◽  
M. Hammerschmidt ◽  
F. Schmidt ◽  
...  

2013 ◽  
Vol 103 (20) ◽  
pp. 201902 ◽  
Author(s):  
Zhi-fang Zhang ◽  
Chun-hua Xue ◽  
Hai-tao Jiang ◽  
Hai Lu ◽  
Yun-hui Li ◽  
...  

Author(s):  
M.P. Thomas ◽  
A.R. Waugh ◽  
M.J. Southon ◽  
Brian Ralph

It is well known that ion-induced sputtering from numerous multicomponent targets results in marked changes in surface composition (1). Preferential removal of one component results in surface enrichment in the less easily removed species. In this investigation, a time-of-flight atom-probe field-ion microscope A.P. together with X-ray photoelectron spectroscopy XPS have been used to monitor alterations in surface composition of Ni3Al single crystals under argon ion bombardment. The A.P. has been chosen for this investigation because of its ability using field evaporation to depth profile through a sputtered surface without the need for further ion sputtering. Incident ion energy and ion dose have been selected to reflect conditions widely used in surface analytical techniques for cleaning and depth-profiling of samples, typically 3keV and 1018 - 1020 ion m-2.


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