Cl2/BCl3/Ar plasma etching and in situ oxygen plasma treatment for leakage current suppression in AlGaN/GaN high-electron mobility transistors
2011 ◽
Vol 29
(3)
◽
pp. 031204
◽
1999 ◽
Vol 38
(Part 1, No. 2A)
◽
pp. 654-657
◽
Oxygen Plasma Treated Aluminum as a Gate Dielectric for AlGaN/GaN High Electron Mobility Transistors
2009 ◽
Vol 156
(9)
◽
pp. H690
◽