Depth profile analysis of helium in silicon with high-resolution elastic recoil detection analysis
2010 ◽
Vol 28
(3)
◽
pp. 554-557
◽
1995 ◽
Vol 353
(3-4)
◽
pp. 311-315
◽
Keyword(s):
1995 ◽
Vol 353
(3-4)
◽
pp. 311-315
◽
Keyword(s):
1998 ◽
Vol 143
(3)
◽
pp. 371-380
◽
2006 ◽
Vol 376-377
◽
pp. 307-310
◽
2018 ◽
Vol 499
◽
pp. 408-411
◽
1999 ◽
Vol 16
(7)
◽
pp. 493-495
◽
2012 ◽
Vol 10
(0)
◽
pp. 655-660
◽
1996 ◽
Vol 118
(1-4)
◽
pp. 588-592