Influence of thermal noise on measured bond lengths in force measurements using dynamic atomic force microscopy

2010 ◽  
Vol 28 (3) ◽  
pp. C4B12-C4B17 ◽  
Author(s):  
Peter M. Hoffmann
Keyword(s):  
Atomic Force Microscopy ◽  
Thermal Noise ◽  
Force Measurements ◽  
Force Microscopy ◽  
Bond Lengths ◽  
Atomic Force

Thermal noise in contact atomic force microscopy

2021 ◽  
Vol 129 (23) ◽  
pp. 234303
Author(s):  
Chengfu Ma ◽  
Chenggang Zhou ◽  
Jinlan Peng ◽  
Yuhang Chen ◽  
Walter Arnold ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Thermal Noise ◽  
Force Microscopy ◽  
Atomic Force

Direct Force Measurements at Polymer Brush Surfaces by Atomic Force Microscopy

1998 ◽  
Vol 31 (13) ◽  
pp. 4297-4300 ◽  
Author(s):  
Tommie W. Kelley ◽  
Phillip A. Schorr ◽  
Kristin D. Johnson ◽  
Matthew Tirrell ◽  
C. Daniel Frisbie
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Brush ◽  
Force Measurements ◽  
Force Microscopy ◽  
Atomic Force

High resolution noncontact atomic force microscopy imaging with oxygen-terminated copper tips at 78 K

Nanoscale ◽  
2020 ◽  
Vol 12 (5) ◽  
pp. 2961-2965 ◽  
Author(s):  
Damla Yesilpinar ◽  
Bertram Schulze Lammers ◽  
Alexander Timmer ◽  
Saeed Amirjalayer ◽  
Harald Fuchs ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
High Precision ◽  
Organic Molecule ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Bond Lengths ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging

AFM experiments at 78 K with an atomically defined O-terminated Cu tip allow determining bond lengths of an organic molecule with high precision.

scholarly journals Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

2013 ◽  
Vol 4 ◽  
pp. 32-44 ◽  
Author(s):  
Jannis Lübbe ◽  
Matthias Temmen ◽  
Sebastian Rode ◽  
Philipp Rahe ◽  
Angelika Kühnle ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Signal Processing ◽  
Transfer Function ◽  
Spectral Density ◽  
Thermal Noise ◽  
Noise Spectral Density ◽  
Force Microscopy ◽  
Atomic Force ◽  
Noise Limit ◽  
Signal Processing Electronics

The noise of the frequency-shift signal Δf in noncontact atomic force microscopy (NC-AFM) consists of cantilever thermal noise, tip–surface-interaction noise and instrumental noise from the detection and signal processing systems. We investigate how the displacement-noise spectral density d z at the input of the frequency demodulator propagates to the frequency-shift-noise spectral density d Δ f at the demodulator output in dependence of cantilever properties and settings of the signal processing electronics in the limit of a negligible tip–surface interaction and a measurement under ultrahigh-vacuum conditions. For a quantification of the noise figures, we calibrate the cantilever displacement signal and determine the transfer function of the signal-processing electronics. From the transfer function and the measured d z , we predict d Δ f for specific filter settings, a given level of detection-system noise spectral density d z ds and the cantilever-thermal-noise spectral density d z th. We find an excellent agreement between the calculated and measured values for d Δ f . Furthermore, we demonstrate that thermal noise in d Δ f , defining the ultimate limit in NC-AFM signal detection, can be kept low by a proper choice of the cantilever whereby its Q-factor should be given most attention. A system with a low-noise signal detection and a suitable cantilever, operated with appropriate filter and feedback-loop settings allows room temperature NC-AFM measurements at a low thermal-noise limit with a significant bandwidth.

Understanding the Mechanical Properties of Microalgae Using Atomic Force Microscopy

2013 ◽  
Author(s):  
Kristin M. Warren ◽  
Jeremiah Mpagazehe ◽  
C. Fred Higgs ◽  
Philip LeDuc
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
Energy Production ◽  
Industrial Processes ◽  
Force Measurements ◽  
Detailed Understanding ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scenedesmus Dimorphus ◽  
The Individual

From consumer productions to energy production, algae is used in many industrial processes. Understanding the mechanical behavior of algae is important to optimize these processes. To obtain a better understanding of algae cell response, we mechanically characterized single, dried Scenedesmus dimorphus cells. To accomplish this, we used atomic force microscopy (AFM) to image S. dimorphus cells, which enabled us to map the AFM measurements to a location on the individual cells. We were then able to perform force measurements on the AFM to determine the Young’s modulus of S. dimorphus. These findings enable a more detailed understanding of the mechanical properties of a single S. dimorphus cell, which may be useful in many applications.

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