Atomic Force Microscopy with Patterned Cantilevers and Tip Arrays:  Force Measurements with Chemical Arrays

Langmuir ◽  
2000 ◽  
Vol 16 (8) ◽  
pp. 4009-4015 ◽  
Author(s):  
John-Bruce D. Green ◽  
Gil U Lee
Keyword(s):  
Atomic Force Microscopy ◽  
Force Measurements ◽  
Force Microscopy ◽  
Atomic Force

Direct Force Measurements at Polymer Brush Surfaces by Atomic Force Microscopy

1998 ◽  
Vol 31 (13) ◽  
pp. 4297-4300 ◽  
Author(s):  
Tommie W. Kelley ◽  
Phillip A. Schorr ◽  
Kristin D. Johnson ◽  
Matthew Tirrell ◽  
C. Daniel Frisbie
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Brush ◽  
Force Measurements ◽  
Force Microscopy ◽  
Atomic Force

Understanding the Mechanical Properties of Microalgae Using Atomic Force Microscopy

2013 ◽  
Author(s):  
Kristin M. Warren ◽  
Jeremiah Mpagazehe ◽  
C. Fred Higgs ◽  
Philip LeDuc
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
Energy Production ◽  
Industrial Processes ◽  
Force Measurements ◽  
Detailed Understanding ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scenedesmus Dimorphus ◽  
The Individual

From consumer productions to energy production, algae is used in many industrial processes. Understanding the mechanical behavior of algae is important to optimize these processes. To obtain a better understanding of algae cell response, we mechanically characterized single, dried Scenedesmus dimorphus cells. To accomplish this, we used atomic force microscopy (AFM) to image S. dimorphus cells, which enabled us to map the AFM measurements to a location on the individual cells. We were then able to perform force measurements on the AFM to determine the Young’s modulus of S. dimorphus. These findings enable a more detailed understanding of the mechanical properties of a single S. dimorphus cell, which may be useful in many applications.

Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor

2008 ◽  
Vol 79 (3) ◽  
pp. 033708 ◽  
Author(s):  
Hui Xie ◽  
Julien Vitard ◽  
Sinan Haliyo ◽  
Stéphane Régnier ◽  
Mehdi Boukallel
Keyword(s):  
Atomic Force Microscopy ◽  
Force Sensor ◽  
Lateral Force ◽  
Force Measurements ◽  
Force Microscopy ◽  
Atomic Force
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