Extreme high vacuum field emission microscope for study on the inherent fluctuation of field emission

2007 ◽  
Vol 25 (4) ◽  
pp. 1420 ◽  
Author(s):  
B. Cho ◽  
T. Itagaki ◽  
T. Ishikawa ◽  
E. Rokuta ◽  
C. Oshima
Keyword(s):  
Field Emission ◽  
High Vacuum ◽  
Vacuum Field

Charge Contrast Imaging of Nonconductive Samples in the High-Vacuum Field Emission Scanning Electron Microscope

Scanning ◽  
2007 ◽  
Vol 29 (5) ◽  
pp. 230-237 ◽  
Author(s):  
Yuan Ji ◽  
Li Wang ◽  
Xueling Quan ◽  
Jingyong Fu ◽  
Yinqi Zhang ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
High Vacuum ◽  
Vacuum Field ◽  
Contrast Imaging ◽  
Scanning Electron

scholarly journals Design and operation of extremely high vacuum field emission electron gun.

Shinku ◽  
1986 ◽  
Vol 29 (11) ◽  
pp. 544-548 ◽  
Author(s):  
Yoshio ISHIZAWA ◽  
Susumu AOKI ◽  
Chuhei OSHIMA ◽  
Shigeki OTANI
Keyword(s):  
Field Emission ◽  
High Vacuum ◽  
Electron Gun ◽  
Vacuum Field ◽  
Emission Electron

scholarly journals Imaging Uncoated Plant Seeds with In-Lens and Secondary-Electron Detectors in a High-Vacuum Field Emission SEM

2011 ◽  
Vol 17 (S2) ◽  
pp. 248-249
Author(s):  
D Cisneros ◽  
K Ghoshroy ◽  
S Ghoshroy
Keyword(s):  
Field Emission ◽  
Secondary Electron ◽  
High Vacuum ◽  
Vacuum Field ◽  
Plant Seeds

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

A Field Emission System For Transmission Electron Microscopy

1973 ◽  
Vol 31 ◽  
pp. 298-299
Author(s):  
Michel Troyonal ◽  
Huei Pei Kuoal ◽  
Benjamin M. Siegelal
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Optical System ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Objective Lens ◽  
Electron Optical System ◽  
Cross Sectional ◽  
Transmission Electron ◽  
Emission System

A field emission system for our experimental ultra high vacuum electron microscope has been designed, constructed and tested. The electron optical system is based on the prototype whose performance has already been reported. A cross-sectional schematic illustrating the field emission source, preaccelerator lens and accelerator is given in Fig. 1. This field emission system is designed to be used with an electron microscope operated at 100-150kV in the conventional transmission mode. The electron optical system used to control the imaging of the field emission beam on the specimen consists of a weak condenser lens and the pre-field of a strong objective lens. The pre-accelerator lens is an einzel lens and is operated together with the accelerator in the constant angular magnification mode (CAM).

CNT field emission based ultra-high vacuum measurements

2015 ◽  
Author(s):  
Jian Zhang ◽  
Yangyang Zhao ◽  
Yongjun Cheng ◽  
Detian Li ◽  
Changkun Dong
Keyword(s):  
Field Emission ◽  
High Vacuum ◽  
Ultra High Vacuum

Diamond vacuum field emission devices

2004 ◽  
Vol 13 (4-8) ◽  
pp. 975-981 ◽  
Author(s):  
W.P. Kang ◽  
J.L. Davidson ◽  
Y.M. Wong ◽  
K. Holmes
Keyword(s):  
Field Emission ◽  
Vacuum Field ◽  
Field Emission Devices

Complementary Vacuum Field Emission Transistor

2021 ◽  
Vol 68 (10) ◽  
pp. 5244-5249
Author(s):  
Ranajoy Bhattacharya ◽  
Jin-Woo Han ◽  
Jim Browning ◽  
M. Meyyappan
Keyword(s):  
Field Emission ◽  
Vacuum Field

scholarly journals Investigation of local ion-stimulated carbon deposition to create vacuum field emission diodes

2019 ◽  
Vol 1400 ◽  
pp. 044005 ◽  
Author(s):  
I V Panchenko ◽  
N A Shandyba ◽  
A S Kolomiytsev ◽  
S A Lisitsyn
Keyword(s):  
Field Emission ◽  
Carbon Deposition ◽  
Vacuum Field

Energy Filtering of Schottky Field Emission Gun Using Fringe Field Monochromator

1999 ◽  
Vol 5 (S2) ◽  
pp. 646-647
Author(s):  
H.W. Mook ◽  
A.H.V. van Veen ◽  
P. Kruit
Keyword(s):  
Field Emission ◽  
Low Voltage ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Electron Gun ◽  
Fringe Field ◽  
Objective Lens ◽  
Electronic Band ◽  
Energy Width ◽  
Energy Filtering

The energy resolution which can be attained in electron energy loss spectroscopy (EELS) is determined by the energy spread of the electron source. The energy width of a high brightness electron gun (typically 0.4 to 0.8 eV) blurs the energy spectrum. A pre-specimen energy filter or monochromator must be used to reduce the energy width of the beam below 0.1 eV to allow detailed EELS analysis of the electronic band structures in materials. The monochromator can not only improve EELS, but it is also capable of improving the spatial resolution in low voltage SEM, which is limited by the chromatic blur of the objective lens. A new type of monochromator the Fringe Field Monochromator has been designed and experiments in an ultra high vacuum setup show the monochromatisation of a Schottky Field Emission Gun.

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