Reproducible reflection high energy electron diffraction signatures for improvement of AlN using in situ growth regime characterization

Author(s):  
Shawn D. Burnham ◽  
Gon Namkoong ◽  
Kyoung-Keun Lee ◽  
W. Alan Doolittle
2002 ◽  
Vol 80 (4) ◽  
pp. 565-567 ◽  
Author(s):  
T. Koida ◽  
D. Komiyama ◽  
H. Koinuma ◽  
M. Ohtani ◽  
M. Lippmaa ◽  
...  

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