In situspectroscopic ellipsometry analyses of hafnium diboride thin films deposited by single-source chemical vapor deposition
2007 ◽
Vol 25
(1)
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pp. 200-206
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2005 ◽
Vol 23
(6)
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pp. 1619-1625
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2006 ◽
Vol 294
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pp. 389-395
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2014 ◽
Vol 67
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1996 ◽
Vol 2
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pp. 242-244
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