In situspectroscopic ellipsometry analyses of hafnium diboride thin films deposited by single-source chemical vapor deposition

2007 ◽  
Vol 25 (1) ◽  
pp. 200-206 ◽  
Author(s):  
Yu Yang ◽  
Sreenivas Jayaraman ◽  
Brent Sperling ◽  
Do Young Kim ◽  
Gregory S. Girolami ◽  
...  
2005 ◽  
Vol 23 (6) ◽  
pp. 1619-1625 ◽  
Author(s):  
Sreenivas Jayaraman ◽  
Yu Yang ◽  
Do Young Kim ◽  
Gregory S. Girolami ◽  
John R. Abelson

2006 ◽  
Vol 294 (2) ◽  
pp. 389-395 ◽  
Author(s):  
Yu Yang ◽  
Sreenivas Jayaraman ◽  
Do Young Kim ◽  
Gregory S. Girolami ◽  
John R. Abelson

RSC Advances ◽  
2018 ◽  
Vol 8 (40) ◽  
pp. 22552-22558 ◽  
Author(s):  
Clara Sanchez-Perez ◽  
Caroline E. Knapp ◽  
Ross H. Colman ◽  
Carlos Sotelo-Vazquez ◽  
Raija Oilunkaniemi ◽  
...  

Fe-doped TiSe2 thin-films were synthesized via low pressure chemical vapor deposition (LPCVD) of a single source precursor: [Fe(η5-C5H4Se)2Ti(η5-C5H5)2]2 (1).


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