Real-time material quality prediction, fault detection, and contamination control in AlGaN∕GaN high electron mobility transistor metalorganic chemical vapor deposition process using in situ chemical sensing

Author(s):  
Soon Cho ◽  
Gary W. Rubloff ◽  
Michael E. Aumer ◽  
Darren B. Thomson ◽  
Deborah P. Partlow
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