Real-time material quality prediction, fault detection, and contamination control in AlGaN∕GaN high electron mobility transistor metalorganic chemical vapor deposition process using in situ chemical sensing
2005 ◽
Vol 23
(5)
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pp. 1849
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2005 ◽
Vol 23
(4)
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pp. 1386
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1994 ◽
Vol 136
(1-4)
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pp. 261-267
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1992 ◽
Vol 35
(5)
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pp. 635-638
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2011 ◽
Vol 26
(8)
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pp. 085010
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2005 ◽
Vol 44
(8)
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pp. 5909-5912
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