Theoretical study of Cr diffusion in Co–Cr alloy thin film recording media

2002 ◽  
Vol 20 (1) ◽  
pp. 7-13 ◽  
Author(s):  
Ding Jin ◽  
Jian Ping Wang ◽  
Hao Gong
1991 ◽  
Vol 232 ◽  
Author(s):  
T. Kawanabe ◽  
J. G. Park ◽  
M. Naoe

ABSTRACTCo85Cr15-xTax(x:0, 2at%)/Cr films with microscopically flat surface were investigated for high density recording media. These films were deposited on silicon wafer and glass substrates at the substrate temperature Ts of 350 °C at argon pressure as low as sub-mTorr by using Facing Targets Sputtering (FTS) apparatus. The elevating of Ts promoted the Cr(200) orientation in film plane, leading to the in-plane c-axis orientation of Co crystallites. Addition of some elements such as Si, Ge and Ta in Cr thin film was found to stabilize Cr(110) crystal orientation even at Ts of 300 °C.


Author(s):  
Peng Lei ◽  
Congchun Zhang ◽  
Yawen Pang ◽  
Shenyong Yang ◽  
Meiju Zhang

1994 ◽  
Vol 18 (S_1_PMRC_94_1) ◽  
pp. S1_467-470
Author(s):  
Michinobu SUEKANE ◽  
Masao MIYAMURA

2004 ◽  
Vol 43 (3) ◽  
pp. 1006-1012 ◽  
Author(s):  
Sung Hyuck An ◽  
Xuezhe Li ◽  
Sang Youl Kim

1987 ◽  
Vol 23 (5) ◽  
pp. 3645-3647 ◽  
Author(s):  
V. Novotny ◽  
G. Itnyre ◽  
A. Homola ◽  
L. Franco

1997 ◽  
Vol 81 (8) ◽  
pp. 3952-3954 ◽  
Author(s):  
Tao Pan ◽  
Geoffrey W. D. Spratt ◽  
Li Tang ◽  
Li-Lien Lee ◽  
Yongchang Feng ◽  
...  

1995 ◽  
Vol 66 (19) ◽  
pp. 2585-2587 ◽  
Author(s):  
Scott Manalis ◽  
Kenneth Babcock ◽  
James Massie ◽  
Virgil Elings ◽  
Matthew Dugas

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