Influence of elastic-electron scattering on measurements of silicon dioxide film thicknesses by x-ray photoelectron spectroscopy

2001 ◽  
Vol 19 (5) ◽  
pp. 2604-2611 ◽  
Author(s):  
C. J. Powell ◽  
A. Jablonski
1980 ◽  
Vol 22 (1) ◽  
pp. 264-283 ◽  
Author(s):  
H. D. Wohlfahrt ◽  
O. Schwentker ◽  
G. Fricke ◽  
H. G. Andresen ◽  
E. B. Shera

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