Influence of elastic-electron scattering on measurements of silicon dioxide film thicknesses by x-ray photoelectron spectroscopy
2001 ◽
Vol 19
(5)
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pp. 2604-2611
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2001 ◽
Vol 114-116
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pp. 1139-1143
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1992 ◽
Vol 19
(1-12)
◽
pp. 83-88
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Keyword(s):
1985 ◽
Vol 83
(9)
◽
pp. 4824-4824
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1984 ◽
Vol 80
(2)
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pp. 813-821
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