Behavior of ultrathin Al2O3 films in very high electric fields: Scanning tunneling microscope-induced void formation and dielectric breakdown

2001 ◽  
Vol 19 (4) ◽  
pp. 1947-1952 ◽  
Author(s):  
C. Niu ◽  
N. P. Magtoto ◽  
J. A. Kelber
Keyword(s):  
Electric Fields ◽  
Scanning Tunneling Microscope ◽  
Dielectric Breakdown ◽  
Void Formation ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
High Electric Fields ◽  
Al2o3 Films ◽  
Very High

Atomic Force Microscope-Based Lithography of Titanium

1995 ◽  
Vol 380 ◽  
Author(s):  
A. E. Gordon ◽  
D. D. Litfin ◽  
M. S. Hagedorn ◽  
J. Chen ◽  
R. T. Fayfield ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Electric Fields ◽  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Atomic Force ◽  
Hard Contact ◽  
High Electric Fields ◽  
Etching Selectivity ◽  
Nanoscale Features

ABSTRACTAnodization of Ti by high electric fields at the tip of a scanned probe can be used to produce nanoscale features consisting of oxides of Ti. In this manner, Ti can be used as a sacrificial resist for nanoscale lithography by exploiting the etching selectivity differences between Ti and anodized Ti. The anodization was accomplished with an atomic force microscope using Ticoated silicon nitride cantilevers. The anodizing bias voltage is applied to the tip and is independent of the feedback, unlike the scanning tunneling microscope. With this setup we were able to fabricate sub-40 nm lines by direct anodization of Ti. It is also shown that once tip and sample are brought into hard contact, subsequent bending of the cantilever has little effect on the linewidth or thickness of the anodized material.

Electric Field-induced switching among multiple conductance pathways in single-molecule junctions

2021 ◽  
Author(s):  
Tengyang Gao ◽  
Zhichao Pan ◽  
Zhuanyun Cai ◽  
Jueting Zheng ◽  
Chun Tang ◽  
...  
Keyword(s):  
Electric Field ◽  
Electric Fields ◽  
Single Molecule ◽  
Scanning Tunneling Microscope ◽  
Binding Sites ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Field Increase ◽  
Electric Field Increase ◽  
Single Molecule Junctions

Here, we report the switching among multiple conductance pathways achieved by sliding the scanning tunneling microscope tip among different binding sites under different electric fields. With the electric field increase,...

Spatio-Temporal Mapping of Transient Electric Fields With an Ultrafast Scanning Tunneling Microscope

2007 ◽  
Author(s):  
Tian Lan ◽  
Guoqiang Ni
Keyword(s):  
Electric Fields ◽  
Scanning Tunneling Microscope ◽  
Gold Surface ◽  
Ultrashort Laser Pulses ◽  
Transient Signal ◽  
Scanning Tunneling ◽  
Strip Line ◽  
Contact Mode ◽  
Tunneling Microscope ◽  
Spatio Temporal

In this paper, we report experimental results of spatio-temporal mapping of electrical transients scanned in strip direction with an ultrafast scanning tunneling microscope. The transients are pumped by ultrashort laser pulses with duration of 100 fs and a wavelength of 800 nm on a coplanar strip line sample. The signals on a coplanar strip line were measured in both contact and non-contact mode. The resolved transient signal showed a full width at half maximum (FWHM) pulse width of 1.2 ps. The pulses propagate along the CPS at a speed of about 2/3 of the light velocity. The spatial resolution image of the gold surface on the transmission line acquired with the tip by the STM under ambient condition has a resolution on the order of 20 nm.

C70 close-packed surfaces and single molecule void-formation by local electric field through a scanning tunneling microscope tip

2009 ◽  
Vol 94 (4) ◽  
pp. 043107
Author(s):  
Yohei Ohta ◽  
Ryoji Mitsuhashi ◽  
Ryo Nouchi ◽  
Akihiko Fujiwara ◽  
Shojun Hino ◽  
...  
Keyword(s):  
Electric Field ◽  
Single Molecule ◽  
Scanning Tunneling Microscope ◽  
Void Formation ◽  
Local Electric Field ◽  
Scanning Tunneling ◽  
Tunneling Microscope

Scanning tunneling microscopy of E. coli RNA polymerase deposited onto an Au substrate by an electrochemical process

1991 ◽  
Vol 49 ◽  
pp. 378-379
Author(s):  
Rebecca W. Keller ◽  
Carlos Bustamante ◽  
David Bear
Keyword(s):  
Scanning Tunneling Microscope ◽  
Biological Sample ◽  
Substrate Surface ◽  
Electrochemical Process ◽  
Atomic Resolution ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Tunneling Microscope ◽  
E Coli ◽  
Preparation Techniques

Under ideal conditions, the Scanning Tunneling Microscope (STM) can create atomic resolution images of different kinds of samples. The STM can also be operated in a variety of non-vacuum environments. Because of its potentially high resolution and flexibility of operation, it is now being applied to image biological systems. Several groups have communicated the imaging of double and single stranded DNA.However, reproducibility is still the main problem with most STM results on biological samples. One source of irreproducibility is unreliable sample preparation techniques. Traditional deposition methods used in electron microscopy, such as glow discharge and spreading techniques, do not appear to work with STM. It seems that these techniques do not fix the biological sample strongly enough to the substrate surface. There is now evidence that there are strong forces between the STM tip and the sample and, unless the sample is strongly bound to the surface, it can be swept aside by the tip.

STM of freeze-fracture replicas: Problems and promises

1993 ◽  
Vol 51 ◽  
pp. 68-69
Author(s):  
J. T. Woodward ◽  
J. A. N. Zasadzinski
Keyword(s):  
Scanning Tunneling Microscope ◽  
Organic Materials ◽  
Freeze Fracture ◽  
Atomic Resolution ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Molecular Scale ◽  
Organic Surfaces ◽  
Metal Layers ◽  
Conductive Surfaces

The Scanning Tunneling Microscope (STM) offers exciting new ways of imaging surfaces of biological or organic materials with resolution to the sub-molecular scale. Rigid, conductive surfaces can readily be imaged with the STM with atomic resolution. Unfortunately, organic surfaces are neither sufficiently conductive or rigid enough to be examined directly with the STM. At present, nonconductive surfaces can be examined in two ways: 1) Using the AFM, which measures the deflection of a weak spring as it is dragged across the surface, or 2) coating or replicating non-conductive surfaces with metal layers so as to make them conductive, then imaging with the STM. However, we have found that the conventional freeze-fracture technique, while extremely useful for imaging bulk organic materials with STM, must be modified considerably for optimal use in the STM.

The atomic-force microscope and its future in biology

1993 ◽  
Vol 51 ◽  
pp. 704-705
Author(s):  
Jean-Paul Revel
Keyword(s):  
Silicon Nitride ◽  
Laser Beam ◽  
Atomic Force Microscope ◽  
Scanning Tunneling Microscope ◽  
Point Of View ◽  
Scanning Tunneling ◽  
Close Relative ◽  
Tunneling Microscope ◽  
Atomic Force ◽  
Sharp Point

The last few years have been marked by a series of remarkable developments in microscopy. Perhaps the most amazing of these is the growth of microscopies which use devices where the place of the lens has been taken by probes, which record information about the sample and display it in a spatial from the point of view of the context. From the point of view of the biologist one of the most promising of these microscopies without lenses is the scanned force microscope, aka atomic force microscope.This instrument was invented by Binnig, Quate and Gerber and is a close relative of the scanning tunneling microscope. Today's AFMs consist of a cantilever which bears a sharp point at its end. Often this is a silicon nitride pyramid, but there are many variations, the object of which is to make the tip sharper. A laser beam is directed at the back of the cantilever and is reflected into a split, or quadrant photodiode.

FIELD ION MICROSCOPE AND ATOM-PROBE STUDIES OF SCANNING TUNNELING MICROSCOPE TIPS

1988 ◽  
Vol 49 (C6) ◽  
pp. C6-55-C6-59 ◽  
Author(s):  
O. NISHIKAWA ◽  
K. HATTORI ◽  
F. KATSUKI ◽  
M. TOMITORI
Keyword(s):  
Scanning Tunneling Microscope ◽  
Atom Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Field Ion Microscope
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