Surface Roughness Measurement of Additive Manufactured Parts Using Focus Variation Microscopy and Structured Light System

Author(s):  
Xiao Zhang ◽  
Vignesh Suresh ◽  
Yi Zheng ◽  
Shaodong Wang ◽  
Qing Li ◽  
...  

Abstract Surface roughness is a significant parameter when evaluating the quality of products in the additive manufacturing (AM) industry. AM parts are fabricated layer by layer, which is quite different from traditional formative or subtractive methods. A uniform feature can be obtained along the direction of the AM printhead movement on the surface of manufactured components, and a large waviness value can be found in the direction perpendicular to printhead movement. This unique characteristic differentiates additive manufactured parts from casted or machined parts in the way of measuring and defining surface roughness. Therefore, it is necessary to set up new standards to measure surface roughness of AM parts and analyze the variation in the topographical profile. The most widely used instruments for measuring surface roughness are profilometer and laser scanner, but they cannot generate 3D topographical surfaces in real-time. In this work, two non-contact optical methods based on Focus Variation Microscopy (FVM) and Structured Light System (SLS) were adopted to measure the surface topography of the target components. The FVM captures images of objects at different focus levels. By translating the object’s position based on focus profile, a 3D image is obtained by data fusion. The lab-made microscopic SLS was used to perform simultaneous whole surface scanning with the potential to achieve real-time 3D surface reconstruction. The two optical metrology systems generated two totally different point cloud data sets. Limited research has been conducted to verify whether the point cloud data sets generated from different optical systems are following the same distribution. In this paper, a statistical method was applied to test the difference between two systems. By using data analytics approaches for comparison analysis, it was found that surface roughness based on the FVM and the SLS systems has no significant difference from a data fusion point of view, though point cloud data generated were completely different in values. In addition, this paper provided a standard measurement approach for a real-time, non-contact method to estimate the surface roughness of AM parts. The two metrology techniques can be applied for in-situ real-time surface analysis and process planning for AM.

Author(s):  
Mohamed Abdelazeem ◽  
Ahmed Elamin ◽  
Akram Afifi ◽  
Ahmed El-Rabbany

Electronics ◽  
2022 ◽  
Vol 11 (2) ◽  
pp. 263
Author(s):  
Munan Yuan ◽  
Xiru Li ◽  
Longle Cheng ◽  
Xiaofeng Li ◽  
Haibo Tan

Alignment is a critical aspect of point cloud data (PCD) processing, and we propose a coarse-to-fine registration method based on bipartite graph matching in this paper. After data pre-processing, the registration progress can be detailed as follows: Firstly, a top-tail (TT) strategy is designed to normalize and estimate the scale factor of two given PCD sets, which can combine with the coarse alignment process flexibly. Secondly, we utilize the 3D scale-invariant feature transform (3D SIFT) method to extract point features and adopt fast point feature histograms (FPFH) to describe corresponding feature points simultaneously. Thirdly, we construct a similarity weight matrix of the source and target point data sets with bipartite graph structure. Moreover, the similarity weight threshold is used to reject some bipartite graph matching error-point pairs, which determines the dependencies of two data sets and completes the coarse alignment process. Finally, we introduce the trimmed iterative closest point (TrICP) algorithm to perform fine registration. A series of extensive experiments have been conducted to validate that, compared with other algorithms based on ICP and several representative coarse-to-fine alignment methods, the registration accuracy and efficiency of our method are more stable and robust in various scenes and are especially more applicable with scale factors.


2013 ◽  
Vol 34 (22) ◽  
pp. 8215-8234 ◽  
Author(s):  
Andrea Vaccari ◽  
Michael Stuecheli ◽  
Brian Bruckno ◽  
Edward Hoppe ◽  
Scott T. Acton

Acta Numerica ◽  
2014 ◽  
Vol 23 ◽  
pp. 289-368 ◽  
Author(s):  
Gunnar Carlsson

In this paper we discuss the adaptation of the methods of homology from algebraic topology to the problem of pattern recognition in point cloud data sets. The method is referred to aspersistent homology, and has numerous applications to scientific problems. We discuss the definition and computation of homology in the standard setting of simplicial complexes and topological spaces, then show how one can obtain useful signatures, called barcodes, from finite metric spaces, thought of as sampled from a continuous object. We present several different cases where persistent homology is used, to illustrate the different ways in which the method can be applied.


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