A Discussion on Removal Mechanisms in Grinding Polycrystalline Diamond

2014 ◽  
Author(s):  
Florestan Schindler ◽  
Fritz Klocke ◽  
Richard Brocker ◽  
Patrick Mattfeld
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Polycrystalline Diamond ◽  
Short Review ◽  
Experimental Investigations ◽  
Brittle Behavior ◽  
Removal Mechanisms ◽  
Grinding Machine ◽  
Physical And Chemical ◽  
Tool Grinding

In this paper, the removal mechanisms in grinding polycrystalline diamond (PCD) with vitrified bonded diamond grinding wheels are discussed fundamentally. After a short review about the history of diamond machining, the author summarizes the state of the art in PCD grinding and thus deduces gaps and a deficit in research. In order to analyze occurring removal mechanisms in PCD grinding, tool grinding tests were carried out. For the experimental investigations a conventional tool grinding machine has been modified in order to withstand process loads. Subsequent to the tests, the surface integrity of ground PCD inserts has been analyzed in detail for the first time. Therefore, focused ion beam (FIB) preparation, which has minimum invasive influence on the sub surface, was applied in order to get an insight into the substrate. Gained lamellae have been analyzed with transmission electron microscopy (TEM). The drawn conclusion questions solely ductile or brittle behavior as removal mechanisms. With reference to simulation researches about polishing diamond with diamond, alternative removal mechanisms should be regarded as well. Both, thermal and mechanical process loads might lead to thermo-physical and chemical effects on a microscopic scale which influences the material removal even in grinding.

A Discussion on Removal Mechanisms in Grinding Polycrystalline Diamond

2015 ◽  
Vol 138 (1) ◽  
Author(s):  
Florestan Schindler ◽  
Richard Brocker ◽  
Fritz Klocke ◽  
Patrick Mattfeld
Keyword(s):  
Material Removal ◽  
Polycrystalline Diamond ◽  
Material Removal Mechanism ◽  
Mesoscopic Scale ◽  
Tool Manufacture ◽  
Brittle Behavior ◽  
Process Characteristics ◽  
Chemical Effects ◽  
Removal Mechanisms ◽  
First Time

Polycrystalline diamond (PCD) grinding takes an important role in the field of tool manufacture. Regardless, there is still lack of process knowledge about the occurring material removal mechanisms in PCD grinding. In order to get a better understanding of the process characteristics, the surface integrity zone of PCD inserts has been analyzed in detail after grinding for the first time. The drawn conclusion questions solely ductile or brittle behavior as removal mechanisms. Both thermal and mechanical process loads during the grinding process lead to thermophysical and chemical effects on a micro- and mesoscopic-scale and might thus have a significant impact on the material removal mechanism.

A Preparation Method of Diamond Specimens Using an Advanced FIB Microscopy for Micro and Nanoanalysis

2012 ◽  
Vol 531-532 ◽  
pp. 592-595
Author(s):  
Yi Qing Chen ◽  
Feng Zai Tang ◽  
Liang Chi Zhang
Keyword(s):  
Focused Ion Beam ◽  
Preparation Method ◽  
Ion Beam ◽  
Polycrystalline Diamond ◽  
Specimen Preparation ◽  
Atomic Lattice ◽  
Cross Sectional ◽  
Site Specific ◽  
Dual Beam

This paper reports the specimen preparation using an advanced dual beam focused ion beam (FIB) technique for bulk polycrystalline diamond (PCD) composites after dynamic friction polishing (DFP). The technique adapted allows for precisely processing diamond materials at the specific polishing track sites of PCD surface, from which large cross-sectional specimens for SEM/EDS/Raman microanalysis could be successfully created. In addition, an in-situ lift-out method was developed to prepare the site-specific HRTEM specimens which were thin enough for imaging the atomic lattice of diamond and for conducting EELS analysis.

Nanopatterning on Nano-Polycrystalline Diamond and Cubic Boron Nitride Using Focused Ion Beam and Heat Treatment to Fabricate Textured Cutting Tools

2016 ◽  
Vol 874 ◽  
pp. 543-548 ◽  
Author(s):  
Noritaka Kawasegi ◽  
Kazuma Ozaki ◽  
Noboru Morita ◽  
Kazuhito Nishimura ◽  
Makoto Yamaguchi ◽  
...  
Keyword(s):  
Heat Treatment ◽  
Boron Nitride ◽  
Single Crystal ◽  
Focused Ion Beam ◽  
High Efficiency ◽  
Ion Beam ◽  
Cubic Boron Nitride ◽  
Cutting Tools ◽  
Polycrystalline Diamond ◽  
Single Crystal Diamond

Texturing on the surface of cutting tools is an effective method to improve the friction and resultant machining performances of the tool. In this study, to fabricate nanotextures on various tools used for precision cutting, a patterning method on nanopolycrystalline diamond and cubic boron nitride tools was investigated using focused ion beam (FIB) irradiation and heat treatment. Patterning was possible using this method, and the patterning characteristics were different from those of single-crystal diamond. This method was more suitable for cutting tools compared with direct FIB machining because of its high efficiency and significantly low affected layer.

scholarly journals Numerical Investigation of Polymer Coated Nanoporous Gold

Materials ◽  
2019 ◽  
Vol 12 (13) ◽  
pp. 2178 ◽  
Author(s):  
Stephan Gnegel ◽  
Jie Li ◽  
Nadiia Mameka ◽  
Norbert Huber ◽  
Alexander Düster
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
Nanoporous Gold ◽  
Polymeric Coating ◽  
Experimental Investigations ◽  
Electrolytic Coating ◽  
Window Method ◽  
Voxel Model ◽  
Nanoporous Metals

Nanoporous metals represent a fascinating class of materials. They consist of a bi-continuous three-dimensional network of randomly intersecting pores and ligaments where the ligaments form the skeleton of the structure. The open-pore structure allows for applying a thin electrolytic coating on the ligaments. In this paper, we will investigate the stiffening effect of a polymer coating numerically. Since the coating adds an additional difficulty for the discretization of the microstructure by finite elements, we apply the finite cell method. This allows for deriving a mesh in a fully automatic fashion from the high resolution 3D voxel model stemming from the 3D focused ion beam-scanning electron microscope tomography data of nanoporous gold. By manipulating the voxel model in a straightforward way, we add a thin polymer layer of homogeneous thickness numerically and study its effect on the macroscopic elastic properties systematically. In order to lower the influence of the boundary conditions on the results, the window method, which is known from homogenization procedures, is applied. In the second part of the paper, we fill the gap between numerical simulations and experimental investigations and determine real material properties of an electrolytic applied polypyrrole coating by inverse computations. The simulations provide an estimate for the mechanical properties of the ligaments and the polymeric coating and are in accordance with experimental data.

MORPHOLOGY CONTROL OF CARBON NANOTUBES THROUGH FOCUSED ION BEAMS

NANO ◽  
2008 ◽  
Vol 03 (06) ◽  
pp. 449-454 ◽  
Author(s):  
M. LOYA ◽  
J. E. PARK ◽  
L. H. CHEN ◽  
K. S. BRAMMER ◽  
P. R. BANDARU ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Multiwall Carbon Nanotubes ◽  
Chemical Properties ◽  
Defect Engineering ◽  
Ion Milling ◽  
Induced Changes ◽  
Physical And Chemical ◽  
Multiwall Carbon

This research demonstrates the capability of controlled, focused ion beam (FIB)–assisted tailoring of morphologies in both multiwall carbon nanotubes (CNTs) and Y junction nonlinear CNT systems through defect engineering. We have shown that a 30 keV FIB Ga + ion beam at low ion milling currents of 1 pA can be used to partially reduce the CNT diameter, to provide electrical conduction bottleneck morphologies for linear CNTs, and to introduce both additive and subractive defects at Y junction locations of Y-CNT samples. Our aim is for this work to provide motivation for additional research to determine the effects of ion-beam-induced changes in modulating the physical and chemical properties of nanotubes.

Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography

2017 ◽  
Vol 23 (2) ◽  
pp. 194-209 ◽  
Author(s):  
Ty J. Prosa ◽  
David J. Larson
Keyword(s):  
Atom Probe Tomography ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Short Review ◽  
Atom Probe ◽  
Specimen Preparation ◽  
Transmission Electron ◽  
Milling Method ◽  
Key Steps ◽  
Backscatter Diffraction

AbstractApproximately 30 years after the first use of focused ion beam (FIB) instruments to prepare atom probe tomography specimens, this technique has grown to be used by hundreds of researchers around the world. This past decade has seen tremendous advances in atom probe applications, enabled by the continued development of FIB-based specimen preparation methodologies. In this work, we provide a short review of the origin of the FIB method and the standard methods used today for lift-out and sharpening, using the annular milling method as applied to atom probe tomography specimens. Key steps for enabling correlative analysis with transmission electron-beam backscatter diffraction, transmission electron microscopy, and atom probe tomography are presented, and strategies for preparing specimens for modern microelectronic device structures are reviewed and discussed in detail. Examples are used for discussion of the steps for each of these methods. We conclude with examples of the challenges presented by complex topologies such as nanowires, nanoparticles, and organic materials.

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