Thickness Uniformity Inspection With Comparison Off-Axis Digital Holography

2016 ◽  
Author(s):  
Jinan Jin ◽  
Sungbin Jeon ◽  
Janghyun Cho ◽  
No-Cheol Park
Keyword(s):  
Comparative Analysis ◽  
Digital Holography ◽  
Depth Resolution ◽  
Field Of View ◽  
Large Field ◽  
Holographic Method ◽  
Tilt Correction ◽  
Thickness Uniformity ◽  
Standard Product ◽  
High Depth

This research proposes a comparison off-axis digital holographic technology for thickness uniformity inspection of transparent products. Compared to existing technologies, the comparison off-axis digital holographic method has advantages such as high depth resolution and large field of view. Also, the proposed method can measure the thickness differences between standard product and the ones produced by one shot imaging with tilt correction. Comparative analysis is used to demonstrate the effectiveness.

Research on scanning infrared digital holography with large field of view

2021 ◽  
Author(s):  
dongshun zhang ◽  
hao feng ◽  
zhiyuan zheng ◽  
zili zhang ◽  
Haochong Huang
Keyword(s):  
Digital Holography ◽  
Field Of View ◽  
Large Field

scholarly journals Fresnel incoherent digital holography with large field-of-view

2019 ◽  
Vol 68 (10) ◽  
pp. 104204 ◽  
Author(s):  
Ming-Yu Tang ◽  
Meng-Ting Wu ◽  
Rui-Huan Zang ◽  
Teng-Da Rong ◽  
Yan-Li Du ◽  
...  
Keyword(s):  
Digital Holography ◽  
Field Of View ◽  
Large Field

Review on high resolution and large field of view digital holography

2019 ◽  
Vol 48 (6) ◽  
pp. 603008
Author(s):  
张文辉 Zhang Wenhui ◽  
曹良才 Cao Liangcai ◽  
金国藩 Jin Guofan
Keyword(s):  
High Resolution ◽  
Digital Holography ◽  
Field Of View ◽  
Large Field

A New Numerical Model for Electron-Probe Analysis at High Depth Resolution

1996 ◽  
Vol 54 ◽  
pp. 490-491
Author(s):  
P.-F. Staub ◽  
C. Bonnelle ◽  
F. Vergand ◽  
P. Jonnard
Keyword(s):  
Electron Probe ◽  
Surface Segregation ◽  
Depth Distribution ◽  
Computing Time ◽  
Depth Resolution ◽  
Physical Parameters ◽  
Electron Probe Analysis ◽  
Interface Phases ◽  
Excitation Conditions ◽  
High Depth

Characterizing dimensionally and chemically nanometric structures such as surface segregation or interface phases can be performed efficiently using electron probe (EP) techniques at very low excitation conditions, i.e. using small incident energies (0.5<E0<5 keV) and low incident overvoltages (1<U0<1.7). In such extreme conditions, classical analytical EP models are generally pushed to their validity limits in terms of accuracy and physical consistency, and Monte-Carlo simulations are not convenient solutions as routine tools, because of their cost in computing time. In this context, we have developed an intermediate procedure, called IntriX, in which the ionization depth distributions Φ(ρz) are numerically reconstructed by integration of basic macroscopic physical parameters describing the electron beam/matter interaction, all of them being available under pre-established analytical forms. IntriX’s procedure consists in dividing the ionization depth distribution into three separate contributions:

Numerical analysis of shift error in X-ray phase contrast imaging for large field of view

2017 ◽  
Vol 34 (1) ◽  
pp. 8
Author(s):  
Jianheng Huang ◽  
Yaohu Lei ◽  
Xin Liu ◽  
Jinchuan Guo ◽  
Ji Li ◽  
...  
Keyword(s):  
Numerical Analysis ◽  
Phase Contrast ◽  
Field Of View ◽  
Phase Contrast Imaging ◽  
Large Field ◽  
Contrast Imaging ◽  
X Ray

Large Field-of-View Super-Resolution Optical Microscopy Based on Planar Polymer Waveguides

ACS Photonics ◽  
2021 ◽  
Author(s):  
Anders Kokkvoll Engdahl ◽  
Stefan Belle ◽  
Tung-Cheng Wang ◽  
Ralf Hellmann ◽  
Thomas Huser ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Super Resolution ◽  
Field Of View ◽  
Large Field ◽  
Polymer Waveguides
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