Evaluation of the Creep Response of Lead Free Solder Materials Subjected to Thermal Cycling

Author(s):  
S. M. Kamrul Hasan ◽  
Abdullah Fahim ◽  
Jeffrey C. Suhling ◽  
Pradeep Lall

Abstract In the electronic assembly arena, lead is being targeted due to the concern regarding environmental pollutants. So, the lead-free solder and its reliability are getting highlighted. During qualification testing or actual use lead-free solders in electronic assemblies, they are often subjected to thermal cycling. In the lead-free solder material, microstructural evolution and material property degradation occurs due to the thermal aging phenomena during dwell periods at the high temperature extreme of thermal cycling. In addition, during ramping between low and high temperature extreme, lead-free solders can experience additional aging phenomena. In our prior work, we have compared material properties (stiffness and strength) degradation of lead-free solder materials in isothermal aging and five different thermal cycling exposures. Changes in material properties were higher for all the thermal cycling exposures compared to the aging. In addition, microstructural evolution and material property degradation were exacerbated as the ramp rate decreased in the thermal cycling. In this study, the creep behavior evolutions occurring in SAC305 lead free solder subjected to isothermal aging and slow thermal cycling exposures have been investigated. Uniaxial test specimens were prepared by reflowing solder in rectangular cross-section glass tubes with a controlled temperature profile. Afterwards, the reflowed samples were exposed to either isothermal aging at 125 °C, or to thermal cycling from −40 to +125 °C, under a stress-free condition (no load) for various durations in an environmental chamber. A slow thermal cycling profile, e.g. 150 minutes cycle with 45 minutes ramps and 30 minutes dwells, was chosen for this study as it was found in our previous work that it caused the most detrimental effects on the mechanical behavior evolution. The thermally exposed samples were isothermally aged for 0, 1, 2, and 5 days; or were thermally cycled for 0, 48, 96, and 240 slow thermal cycles, which had the same aging times at the high temperature extreme of T = 125 °C. After aging or cycling, creep testing was performed at room temperature on the thermally exposed samples at three different stress levels (10, 12, 15 MPa). The evolutions of the secondary creep strain rate were obtained as a function of the stress level, as well as the net aging time at the high temperature extreme, and then compared. Results showed that secondary creep strain rate increased dramatically with equivalent aging time, and that the degradation effects were larger for slow thermal cycling than for pure aging. For example, the creep rate increased by 3.0–3.4X for 5 days of pure aging at T = 125 °C; while they increased by 10.9–13.1X for 240 thermal cycles, when there had been 5 days of equivalent aging at the T = 125 °C high temperature extreme.

Author(s):  
S. M. Kamrul Hasan ◽  
Abdullah Fahim ◽  
Jeffrey C. Suhling ◽  
Sa’d Hamasha ◽  
Pradeep Lall

Abstract Lead free electronic assemblies are often subjected to thermal cycling during qualification testing or during actual use. The dwell periods at the high temperature extreme during thermal cycling cause thermal aging phenomena in the solder material, including microstructural evolution and material property degradation. In addition, lead free solders can also experience aging effects during the ramp periods between the low and high temperature extremes of the cycling. In this study, the mechanical behavior evolution occurring in SAC305 lead free solder subjected to various thermal cycling exposures has been investigated. Uniaxial test specimens were prepared by reflowing solder in rectangular cross-section glass tubes with a controlled temperature profile. After reflow solidification, the samples were placed into the environmental chamber and thermally cycled from −40 C to +125 C under a stress-free condition (no load). Several thermal cycling profiles were examined including: (1) 90 minute cycles with 15 minutes ramps and 30 minutes dwells, (2) air-to-air thermal shock exposures with 30 minutes dwells and near instantaneous ramps, (3) 30 minute cycles with 15 minutes ramps and no dwells (saw tooth profile), (4) 150 minute cycles with 45 minutes ramps and 30 minutes dwells, and (5) no cycling (simple aging at the high temperature extreme). For each profile, 10–15 samples were cycled for various durations of cycling (e.g. 48, 96, and 240 cycles), which were equivalent to various aging times at the high temperature extreme of T = 125 C. After cycling, the stress-strain curves and mechanical properties including effective elastic modulus and Ultimate Tensile Strength (UTS) of all the cycled samples were measured. For each cycling profile, the evolutions of the mechanical properties were characterized as a function of the cycling duration, as well as the net aging time at the high temperature extreme. Comparison of the results of various thermal cycling profiles showed that the detrimental effects of aging are accelerated in a thermal cycling environment. Furthermore, microstructure evolution during thermal cycling has also been investigated to validate the observed mechanical properties degradation. The test results revealed that the mechanical properties degradation of SAC305 are higher in thermal cycling compared to simple equivalent aging. For example, the elastic modulus and UTS of SAC305 reduced by 41%, and 38%, respectively after 5 days aging whereas these properties reduced by 69%, and 51%, respectively after 5 days equivalent aging using thermal cycling profile #4 (240 cycles).


2010 ◽  
Vol 654-656 ◽  
pp. 2450-2454 ◽  
Author(s):  
De Kui Mu ◽  
Hideaki Tsukamoto ◽  
Han Huang ◽  
Kazuhiro Nogita

High-temperature lead-free solders are important materials for electrical and electronic devices due to increasing legislative requirements that aim at reducing the use of traditional lead-based solders. For the successful use of lead-free solders, a comprehensive understanding of the formation and mechanical properties of Intermetallic Compounds (IMCs) that form in the vicinity of the solder-substrate interface is essential. In this work, the effect of nickel addition on the formation and mechanical properties of Cu6Sn5 IMCs in Sn-Cu high-temperature lead-free solder joints was investigated using Scanning Electron Microscopy (SEM) and nanoindentation. It was found that the nickel addition increased the elastic modulus and hardness of the (Cu, Ni)6Sn5. The relationship between the nickel content and the mechanical properties of the IMCs was also established.


Author(s):  
Zijie Cai ◽  
Jeffrey C. Suhling ◽  
Pradeep Lall ◽  
Michael J. Bozack

The microstructure, mechanical response, and failure behavior of lead free solder joints in electronic assemblies are constantly evolving when exposed to isothermal aging and/or thermal cycling environments. In our prior work on aging effects, we have demonstrated that large degradations occur in the material properties (stiffness and strength) and creep behavior of Sn-Ag-Cu (SAC) lead free solders during aging. These effects are universally detrimental to reliability and are exacerbated as the aging temperature and aging time increases. Conversely, changes due to aging are relatively small in conventional Sn-Pb solders. In our current work, we are exploring several doped SAC+X alloys in an attempt to reduce the aging induced degradation of the material behavior of SAC solders. The doped materials are lead free SAC solders that have been modified by the addition of small percentages of one or more additional elements (X). Using dopants (e.g. Bi, In, Ni, La, Mg, Mn, Ce, Co, Ti, Zn, etc.) has become widespread to enhance shock/drop reliability, wetting, and other properties; and we have extended this approach to examine the ability of dopants to reduce the effects of aging and extend thermal cycling reliability. In this paper, we concentrate on presenting the results for SAC+X (X = Zn, Co, Ni). The enhancement of aging resistance for the doped lead free solders was explored. Comparisons were made to the responses of non-doped SAC lead free solder alloys. The effects of aging on mechanical behavior have been examined by performing stress-strain and creep tests on solder samples that were aged for various durations (0–6 months) at elevated temperature (100 °C). Variations of the mechanical and creep properties (elastic modulus, yield stress, ultimate strength, creep compliance, etc.) were observed and modeled as a function of aging time and aging temperature. Our findings show that the doped SAC+X alloys illustrate reduced degradations with aging for all of the aging temperatures considered. Also, the stress-strain and creep mechanical properties of doped solders are better than those of reference solders after short durations of aging. After long term aging, doped solder alloys were found to have more stable behaviors than those of the standard SAC alloys. A parallel microstructure study has shown that less degradation and coarsening of the phases occurs in doped solder materials relative to non-doped solders after severe aging.


2012 ◽  
Vol 476-478 ◽  
pp. 1163-1168 ◽  
Author(s):  
M.Z. Shahrul Fadzli ◽  
M.A. Azmah Hanim ◽  
T. Sai Hong ◽  
A. Aidy ◽  
R. Rohaizuan

The development works on high temperature lead free solder are mostly discussed nowadays. To replace the current high temperature lead free solders, further research need to be done. A great deal of effort has been put into the development of lead free solder alloys. Bi (Bismuth) and Sb (Antimony) solder system proved as one of the promising candidates for electronic assembly. Melting temperature of three Bi-Sb solder alloys studied in this research enhanced their potential as the alternative solder candidates for high temperature lead free solder. At interface, Cu3Sb IMC layer was formed for 95Bi-5Sb solder alloy. Spallation of Cu3Sb IMC layer took placed with the results of Cu3Sb IMC also found in the solder bulk. Analysis of 97.5Bi-2.5Sb solder alloy classified as no metallurgical reaction at the interface and only the mechanical joining existed at the interface. The dissolution of Cu from subtrate affected the formation of Cu rich phase and the unstable Bi-Cu rich phase phenomena act as the isothermal product found in solder bulk. Mechanical grain boundary grooving observed in 98.5Bi-1.5Sb solder alloys at interface. Different compositions of Bi-Sb solder alloys resulted in different types of microstructures at interface and in solder bulk after reflow.


2013 ◽  
Vol 795 ◽  
pp. 518-521 ◽  
Author(s):  
Sayyidah Amnah Musa ◽  
Mohd Arif Anuar Mohd Salleh ◽  
Saud Norainiza

The developments of lead-free solders have become a major concern to the researchers in electronic industry to replace the lead-containing materials. The concern is not just for low temperature solders but also for high temperature solders. The lead and lead-based compound are highly toxic which is dangerous to human health and environment. The highly suitable lead-free solder candidates for replacing high Pb high temperature solder are Au-Sn, Al-Zn, Zn-Sn, Sn-Sb, and Bi-Ag solders. However, Zn-Sn based solder has highly recommended as the best candidates in replacing high lead high temperature solder. This paper provides a short review of recent research on Zn-Sn based lead free high temperature solders with different additional alloying elements. The new novel alloy of Zn-Sn based for high temperature solder applications will be proposed in this paper.


2015 ◽  
Vol 10 (1) ◽  
pp. 2641-2648
Author(s):  
Rizk Mostafa Shalaby ◽  
Mohamed Munther ◽  
Abu-Bakr Al-Bidawi ◽  
Mustafa Kamal

The greatest advantage of Sn-Zn eutectic is its low melting point (198 oC) which is close to the melting point. of Sn-Pb eutectic solder (183 oC), as well as its low price per mass unit compared with Sn-Ag and Sn-Ag-Cu solders. In this paper, the effect of 0.0, 1.0, 2.0, 3.0, 4.0, and 5.0 wt. % Al as ternary additions on melting temperature, microstructure, microhardness and mechanical properties of the Sn-9Zn lead-free solders were investigated. It is shown that the alloying additions of Al at 4 wt. % to the Sn-Zn binary system lead to lower of the melting point to 195.72 ˚C.  From x-ray diffraction analysis, an aluminium phase, designated α-Al is detected for 4 and 5 wt. % Al compositions. The formation of an aluminium phase causes a pronounced increase in the electrical resistivity and microhardness. The ternary Sn-9Zn-2 wt.%Al exhibits micro hardness superior to Sn-9Zn binary alloy. The better Vickers hardness and melting points of the ternary alloy is attributed to solid solution effect, grain size refinement and precipitation of Al and Zn in the Sn matrix.  The Sn-9%Zn-4%Al alloy is a lead-free solder designed for possible drop-in replacement of Pb-Sn solders.  


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