Heater Size Effect on Temperature Sensing With Wollaston Scanning Thermal Microprobes

2011 ◽  
Author(s):  
Liang Han ◽  
Yanliang Zhang ◽  
Theodorian Borca-Tasciuc
Keyword(s):  
Thermal Properties ◽  
Size Effect ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Thermal Contact ◽  
Thermal Characterization ◽  
Temperature Sensing ◽  
Scanning Thermal Microscopy ◽  
Minimal Sample ◽  
Precise Quantification

Scanning thermal microscopy (SThM) is an attractive tool for high spatial resolution thermal characterization with minimal sample preparation1. However, complex thermal contact mechanisms often hinder precise quantification of the sample temperature or thermal properties.2

Tip-Sample Heat Transfer in Non-Contact Mode Scanning Thermal Microscopy With Wollaston Microprobes

2011 ◽  
Author(s):  
Yanliang Zhang ◽  
Liang Han ◽  
Theodorian Borca-Tasciuc
Keyword(s):  
Heat Transfer ◽  
High Spatial Resolution ◽  
Thermal Characterization ◽  
Scanning Thermal Microscopy ◽  
Solid Contact ◽  
Sample Heat ◽  
Contact Mode ◽  
Thermal Microscopy ◽  
Liquid Meniscus ◽  
Minimal Sample

Scanning thermal microscopy (SThM) is an attractive tool for high spatial resolution thermal characterization with minimal sample preparation.1 SThM measurements are usually performed in contact-mode, which entails multiple tip-sample heat transfer pathways, i.e. across air gap, liquid meniscus, and the solid contact. These hinder the quantification of the sample temperature or thermal properties or result in large uncertainties.2

scholarly journals Scanning Thermal Microscopy of Ultrathin Films: Numerical Studies Regarding Cantilever Displacement, Thermal Contact Areas, Heat Fluxes, and Heat Distribution

Nanomaterials ◽  
2021 ◽  
Vol 11 (2) ◽  
pp. 491
Author(s):  
Christoph Metzke ◽  
Fabian Kühnel ◽  
Jonas Weber ◽  
Günther Benstetter
Keyword(s):  
Thermal Properties ◽  
Ultrathin Films ◽  
Hexagonal Boron Nitride ◽  
Thermal Contact ◽  
Heat Transfer Process ◽  
Heat Propagation ◽  
Heat Fluxes ◽  
Detailed Knowledge ◽  
Scanning Thermal Microscopy ◽  
Thermal Microscopy

New micro- and nanoscale devices require electrically isolating materials with specific thermal properties. One option to characterize these thermal properties is the atomic force microscopy (AFM)-based scanning thermal microscopy (SThM) technique. It enables qualitative mapping of local thermal conductivities of ultrathin films. To fully understand and correctly interpret the results of practical SThM measurements, it is essential to have detailed knowledge about the heat transfer process between the probe and the sample. However, little can be found in the literature so far. Therefore, this work focuses on theoretical SThM studies of ultrathin films with anisotropic thermal properties such as hexagonal boron nitride (h-BN) and compares the results with a bulk silicon (Si) sample. Energy fluxes from the probe to the sample between 0.6 µW and 126.8 µW are found for different cases with a tip radius of approximately 300 nm. A present thermal interface resistance (TIR) between bulk Si and ultrathin h-BN on top can fully suppress a further heat penetration. The time until heat propagation within the sample is stationary is found to be below 1 µs, which may justify higher tip velocities in practical SThM investigations of up to 20 µms−1. It is also demonstrated that there is almost no influence of convection and radiation, whereas a possible TIR between probe and sample must be considered.

High-spatial-resolution Distributed Temperature Sensing System Based on a Mode-locked Fiber Laser

2020 ◽  
Author(s):  
Anton O. Chernutsky ◽  
Dmitriy A. Dvoretskiy ◽  
Ilya O. Orekhov ◽  
Stanislav G. Sazonkin ◽  
Yan Zh. Ososkov ◽  
...  
Keyword(s):  
Fiber Laser ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Temperature Sensing ◽  
Distributed Temperature Sensing ◽  
Sensing System

High-spatial-resolution distributed optical fiber strain or temperature sensing

1999 ◽  
Author(s):  
Princy L. Julian ◽  
Mahmoud Farhadiroushan ◽  
Vincent A. Handerek ◽  
Alan J. Rogers
Keyword(s):  
Optical Fiber ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Temperature Sensing ◽  
Distributed Optical Fiber

Realizing the nanoscale quantitative thermal mapping of scanning thermal microscopy by resilient tip–surface contact resistance models

2018 ◽  
Vol 3 (5) ◽  
pp. 505-516 ◽  
Author(s):  
Yifan Li ◽  
Nitin Mehra ◽  
Tuo Ji ◽  
Jiahua Zhu
Keyword(s):  
Thermal Properties ◽  
Contact Resistance ◽  
Quantitative Assessment ◽  
Thermal Contact Resistance ◽  
Thermal Contact ◽  
Scanning Thermal Microscopy ◽  
Thermal Microscopy ◽  
Substrate Interface ◽  
Surface Contact ◽  
Surface Contact Resistance

Quantitative assessment of thermal properties by scanning thermal microscopy (SThM) is a demanded technology, but still not yet available due to the presence of unpredictable thermal contact resistance (TCR) at the tip/substrate interface.

High spatial resolution AEM observations of yttrium segregation in chromia scales grown on Co-45%Cr

1986 ◽  
Vol 44 ◽  
pp. 518-519
Author(s):  
K. Przybylski ◽  
A. J. Garratt-Reed ◽  
G. J. Yurek
Keyword(s):  
Spatial Resolution ◽  
Outer Surface ◽  
Maximum Concentration ◽  
High Spatial Resolution ◽  
Reactive Elements ◽  
Chromia Scales

The addition of so-called “reactive” elements such as yttrium to alloys is known to enhance the protective nature of Cr2O3 or Al2O3 scales. However, the mechanism by which this enhancement is achieved remains unclear. An A.E.M. study has been performed of scales grown at 1000°C for 25 hr. in pure O2 on Co-45%Cr implanted at 70 keV with 2x1016 atoms/cm2 of yttrium. In the unoxidized alloys it was calculated that the maximum concentration of Y was 13.9 wt% at a depth of about 17 nm. SIMS results showed that in the scale the yttrium remained near the outer surface.

Integration of Core-Edge Spectroscopy Methods for the Study of Polymers

1996 ◽  
Vol 54 ◽  
pp. 154-155
Author(s):  
E. G. Rightor
Keyword(s):  
Excited State ◽  
Polymer Blends ◽  
Gas Phase ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Electronic States ◽  
Core Electron ◽  
Bulk Solids ◽  
Development Application

Core edge spectroscopy methods are versatile tools for investigating a wide variety of materials. They can be used to probe the electronic states of materials in bulk solids, on surfaces, or in the gas phase. This family of methods involves promoting an inner shell (core) electron to an excited state and recording either the primary excitation or secondary decay of the excited state. The techniques are complimentary and have different strengths and limitations for studying challenging aspects of materials. The need to identify components in polymers or polymer blends at high spatial resolution has driven development, application, and integration of results from several of these methods.

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