Investigation of Thermal Effect of Packaged CMOS Compatible Pressure Sensor
Keyword(s):
In this study, a packaged silicon base piezoresistive pressure sensor with thermal stress buffer is designed, fabricated, and measured. A finite element method (FEM) is adopted for design and experimental validation of the sensor performance. Thermal and pressure loading on the sensor is applied to make a comparison between sensor experimental and simulation results. Furthermore, a method that transfers simulation stress data into output voltage is proposed in this study, the results indicate that the experimental result coincides with simulation data.
2013 ◽
Vol 313-314
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pp. 666-670
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2013 ◽
Vol 411-414
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pp. 1552-1558
2021 ◽
2009 ◽
Vol 150
(1)
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pp. 69-77
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