Investigation of Protein/Lipid Interactions via Scanning Probe Acceleration Microscopy: Theory and Experiment

Author(s):  
Justin Legleiter ◽  
Kathleen A. Burke ◽  
Elizabeth A. Yates

There is great interest in the application of proximal probe techniques to simultaneously image and measure mechancial properties of surfaces with nanoscale spatial resolution. There have been several innovations in generating time-resolved force interaction between the tip and surface while acquiring a tapping mode AFM image. These tip/sample forces contain information regarding mechanical properties of surfaces in an analogous fashion to a force curve experiment. Here, we demonstrate, via simulation, that the maximum and minimum tapping forces change with respect to the Young’s modulus and adhesiveness of a surface, but the roughness of the surfaces has no effect on the tapping forces. Using these changes in tapping forces, we determine the mechanical changes of a lipid membrane after exposure to a huntingtin exon1 (htt exon1) protein with an expanded polyglutamine (polyQ) domain. Expanded polyQ domains in htt is associated with Huntington’s disease, a genetic neurodegenerative disorder. The htt exon1 protein caused regions of increased surface roughness to appear in the lipid membrane, and these areas were associated with decreased elasticity and adhesion to the AFM probe.

Nano Letters ◽  
2021 ◽  
Author(s):  
Chi Zhang ◽  
Jason M. Bartell ◽  
Jonathan C. Karsch ◽  
Isaiah Gray ◽  
Gregory D. Fuchs
Keyword(s):  

2006 ◽  
Vol 39 (6) ◽  
pp. 871-877 ◽  
Author(s):  
Ying-Huang Lai ◽  
Ya-Sen Sun ◽  
U-Ser Jeng ◽  
Jhih-Min Lin ◽  
Tsang-Lang Lin ◽  
...  

A SWAXS (small- and wide-angle X-ray scattering) instrument was recently installed at the wiggler beamline BL17B3 of the National Synchrotron Radiation Research Center (NSRRC), Taiwan. The instrument, which is designed for studies of static and dynamic nanostructures and correlations between the nano (ormeso) structure (SAXS) and crystalline structure (WAXS), provides a flux of 1010–1011photon s−1at the sample at energies between 5 and 14 keV. With a SAXS area detector and a WAXS linear detector connected to two data acquisition systems operated in master–slave mode, the instrument allows one to perform time-resolved as well as anomalous scattering measurements. Data reduction algorithms have been developed for rapid processing of the large SWAXS data sets collected during time-resolved measurements. The performance of the instrument is illustrated by examples taken from different classes of ongoing projects: (i) time-resolved SAXS/WAXS/differential scanning calorimetry (DSC) with a time resolution of 10 s on a semicrystalline poly(hexamethylene terephthalate) sample, (ii) anomalous SAXS/WAXS measurements on a nanoparticulate PtRu catalyst, and (iii) grazing-incidence SAXS of a monolayer of oriented semiconductor quantum wires, and humidity-controlled ordering of Alamethicin peptides embedded in an oriented lipid membrane.


1991 ◽  
Author(s):  
Sten Madsen ◽  
Michael S. Patterson ◽  
Brian C. Wilson ◽  
Young D. Park ◽  
John D. Moulton ◽  
...  

ACS Nano ◽  
2019 ◽  
Vol 13 (3) ◽  
pp. 2812-2821 ◽  
Author(s):  
Rajiv Giridharagopal ◽  
Jake T. Precht ◽  
Sarthak Jariwala ◽  
Liam Collins ◽  
Stephen Jesse ◽  
...  

1999 ◽  
Vol 596 ◽  
Author(s):  
I. I. Smolyaninov ◽  
H. Y. Liang ◽  
C. H. Lee ◽  
C. C. Davis ◽  
L. D. Rotter ◽  
...  

AbstractNear-field second harmonic microscopy is ideally suited for studies of local nonlinearity and poling of ferroelectric materials at the microscopic level. Its main advantages in comparison with other scanning probe techniques are the possibility of fast time-resolved measurements, and substantially smaller perturbation of the sample under investigation caused by the optical probe. We report second harmonic imaging of the surface of thin BaTiO3 films obtained in a near-field microscopy setup using a Ti:sapphire laser system consisting of an oscillator and a regenerative amplifier operating at 810 nm. Optical resolution on the order of 80 nm has been achieved.


2017 ◽  
Vol 24 (2) ◽  
pp. 979-987 ◽  
Author(s):  
Zhenhua Li ◽  
Tielin Shi ◽  
Qi Xia

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