Minimizing Tip-Sample Contact Force in Automated Atomic Force Microscope Based Force Spectroscopy

2009 ◽  
Author(s):  
Monica Rivera ◽  
Carleen Morris ◽  
David Carlson ◽  
Eric J. Toone ◽  
Daniel G. Cole ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Contact Force ◽  
Force Feedback ◽  
Force Spectroscopy ◽  
Sample Surface ◽  
Feedback Process ◽  
Atomic Force ◽  
Sensor Drift ◽  
Maximum Contact ◽  
Maximum Contact Force

In atomic force microscope based force spectroscopy, it is often necessary to minimize the tip-sample contact force. While it is possible to control the contact force using force feedback, this method is susceptible to sensor drift and is often under-utilized due to the noise associated with the feedback process. Here we present a method to control the tip-sample contact force for repeated pulling cycles without relying on force feedback or tedious user-controlled z-stage step increments. The custom pulling program uses the data recorded during the previous retraction cycle to automatically reposition the sample surface to account for changes in topography and system drift. Using this method we were able to complete 250 automated pulling cycles, 76% of which had evidence of tip-sample contact. Of those pulling cycles with tip-sample contact, the average contact force was 83 pN, with the maximum contact force not exceeding 292 pN.

Atomic force microscope-based single-molecule force spectroscopy of RNA unfolding

2011 ◽  
Vol 414 (1) ◽  
pp. 1-6 ◽  
Author(s):  
Hans A. Heus ◽  
Elias M. Puchner ◽  
Aafke J. van Vugt-Jonker ◽  
Julia L. Zimmermann ◽  
Hermann E. Gaub
Keyword(s):  
Atomic Force Microscope ◽  
Single Molecule ◽  
Force Spectroscopy ◽  
Single Molecule Force Spectroscopy ◽  
Atomic Force

Characterization of Multi-Phase and Multi-Component Polymer Systems Using the Atomic Force Microscope

1999 ◽  
Vol 5 (S2) ◽  
pp. 962-963
Author(s):  
M. VanLandingham ◽  
X. Gu ◽  
D. Raghavan ◽  
T. Nguyen
Keyword(s):  
Energy Dissipation ◽  
Atomic Force Microscope ◽  
Mechanical Response ◽  
Sample Surface ◽  
Phase Changes ◽  
Phase Imaging ◽  
Polymer Systems ◽  
Atomic Force ◽  
Phase Images ◽  
Multi Phase

Recent advances have been made on two fronts regarding the capability of the atomic force microscope (AFM) to characterize the mechanical response of polymers. Phase imaging with the AFM has emerged as a powerful technique, providing contrast enhancement of topographic features in some cases and, in other cases, revealing heterogeneities in the polymer microstructure that are not apparent from the topographic image. The enhanced contrast provided by phase images often allows for identification of different material constituents. However, while the phase changes of the oscillating probe are associated with energy dissipation between the probe tip and the sample surface, the relationship between this energy dissipation and the sample properties is not well understood.As the popularity of phase imaging has grown, the capability of the AFM to measure nanoscale indentation response of polymers has also been explored. Both techniques are ideal for the evaluation of multi-phase and multi-component polymer systems.

Midas: A Nanotechnological Exploration of Touch

Leonardo ◽  
2009 ◽  
Vol 42 (3) ◽  
pp. 186-192 ◽  
Author(s):  
Paul Thomas
Keyword(s):  
Atomic Force Microscope ◽  
Force Spectroscopy ◽  
Atomic Force ◽  
Atomic Vibrations ◽  
Surface Vibrations

The Midas project investigates the trans-mediational space between skin and gold. Research for the project was conducted through the analysis of data recorded with an Atomic Force Microscope (AFM). The AFM, in its force spectroscopy mode, gathers data by picking up the surface vibrations as the cantilever touches the cell. The Midas project culminated in an installation that included data projection and audio work utilizing subsonic speakers to make the data from the atomic vibrations audible and palpable.

Machining Complex Three-Dimensional Nanostructures With an Atomic Force Microscope Through the Frequency Control of the Tip Reciprocating Motions

2016 ◽  
Vol 138 (12) ◽  
Author(s):  
Yanquan Geng ◽  
Yongda Yan ◽  
Emmanuel Brousseau ◽  
Xing Cui ◽  
Bowen Yu ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Force Feedback ◽  
Normal Load ◽  
Frequency Control ◽  
Three Dimensional ◽  
Atomic Force ◽  
Combined Control ◽  
Novel Method ◽  
Lateral Displacements ◽  
Floor Surfaces

A novel method relying on atomic force microscope (AFM) tip based nanomachining is presented to enable the fabrication of microchannels that exhibit complex three-dimensional (3D) nanoscale floor surface geometries. To achieve this, reciprocating lateral displacements of the tip of an AFM probe are generated, while a high-precision stage is also actuated to move in a direction perpendicular to such tip motions. The width and length of microchannels machined in this way are determined by the amplitude of the tip motion and the stage displacement, respectively. Thus, the processing feed can be changed during the process as it is defined by the combined control of the frequency of the tip reciprocating motions and the stage speed. By employing the built-in force feedback loop of conventional AFM systems during such operations, the variation of the feed leads to different machined depths. Thus, this results in the capability to generate complex 3D nanostructures, even for a given normal load, which is set by the AFM user prior to the start of the process. In this paper, the fabrication of different microchannels with floor surfaces following half triangular, triangular, sinusoidal, and top-hat waveforms is demonstrated. It is anticipated that this method could be employed to fabricate complex nanostructures more readily compared to traditional vacuum-based lithography processes.

Nano-Contact Force Calculation Method of Different Tip Radius of Curvature and the Specimen Surface of AFM

2015 ◽  
Vol 723 ◽  
pp. 952-957
Author(s):  
Guo Dong Cheng ◽  
Xiao Jing Yang
Keyword(s):  
Atomic Force Microscope ◽  
Contact Force ◽  
Calculation Model ◽  
Specimen Surface ◽  
Radius Of Curvature ◽  
Force Model ◽  
Atomic Force ◽  
Working Principle ◽  
Tip Radius ◽  
Force Calculation

Atomic Force Microscope (AFM) works by the force between the probe tip and specimen surface. The nanocontact force between the probe tip and specimen surface has an important influence on the detection surface. Base on the analysis of the working principle of the AFM and nanocontact force calculation model, according to Hamaker assumptions, using continuum method established the theoretical contact force model of the AFM tip. the contact force calculation methods of contact pressure in process has been obtained. The variation of the force between the probe tip and specimen surface has been found by calculation model and programming calculation of Matlab. Provide the basis for improving the accuracy of an atomic force microscope surface inspection and error analysis

Quantifying bacterial adhesion on antifouling polymer brushes via single-cell force spectroscopy

2015 ◽  
Vol 6 (31) ◽  
pp. 5740-5751 ◽  
Author(s):  
Cesar Rodriguez-Emmenegger ◽  
Sébastien Janel ◽  
Andres de los Santos Pereira ◽  
Michael Bruns ◽  
Frank Lafont
Keyword(s):  
Atomic Force Microscope ◽  
Single Cell ◽  
Bacterial Adhesion ◽  
Bacterial Cell ◽  
Polymer Brushes ◽  
Force Spectroscopy ◽  
Adhesion Forces ◽  
Atomic Force ◽  
Cell Force

The adhesion forces between a single bacterial cell and different polymer brushes were measured directly with an atomic force microscope and correlated with their resistance to fouling.

Fast imaging and fast force spectroscopy of single biopolymers with a new atomic force microscope designed for small cantilevers

1999 ◽  
Vol 70 (11) ◽  
pp. 4300-4303 ◽  
Author(s):  
M. B. Viani ◽  
T. E. Schäffer ◽  
G. T. Paloczi ◽  
L. I. Pietrasanta ◽  
B. L. Smith ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Force Spectroscopy ◽  
Fast Imaging ◽  
Atomic Force
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