Specimen Design for Mixed Mode Interfacial Fracture Properties Measurement in Electronic Packages
Keyword(s):
A four-layer center cracked beam (CCB) under four point bending loading is developed for the interfacial fracture properties measurement of electronics packaging materials. Determination of the mixed mode interfacial fracture properties along the second and third layers of the CCB specimen is carried out analytically. For a given test specimen, a stable test window (material combination and thickness ratio) has been identified using the analytical expression. Data yield from interfacial mixed mode fracture properties experimental measurement can be enhanced by testing within the testing window. [S1043-7398(00)00101-8]
1989 ◽
Vol 28
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pp. 145-169
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2011 ◽
Vol 24
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pp. 218-226
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2018 ◽
Vol 83
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pp. 2-8
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2018 ◽
2018 ◽
Vol 2018
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pp. J0310202
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2005 ◽
Vol 79
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pp. 2718-2726
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2002 ◽
Vol 124
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pp. 318-322
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