Buckling Instability of Carbon Nanotube Atomic Force Microscope Probe Clamped in an Elastic Medium

2012 ◽  
Vol 3 (2) ◽  
Author(s):  
Jin-Xing Shi ◽  
Toshiaki Natsuki ◽  
Xiao-Wen Lei ◽  
Qing-Qing Ni
Keyword(s):  
Atomic Force Microscope ◽  
Elastic Medium ◽  
Small Diameter ◽  
Beam Model ◽  
Buckling Mode ◽  
Buckling Instability ◽  
Atomic Force ◽  
Buckling Stability ◽  
Afm Probe ◽  
The Stability

Carbon nanotubes (CNTs) can be used as atomic force microscope (AFM) probes due to their robust mechanical properties, high aspect ratio and small diameter. In this study, a model of CNTs clamped in an elastic medium is proposed as CNT AFM probes. The buckling instability of the CNT probe clamped in elastic medium is analyzed based on the nonlocal Euler–Bernoulli beam model and the Whitney–Riley model. The clamped length of CNTs, and the stiffness of elastic medium affect largely on the stability of CNT AFM probe, especially at high buckling mode. The result shows that the buckling stability of the CNT AFM probe can be largely enhanced by increasing the stiffness of elastic medium. Moreover, the nonlocal effects of buckling instability are investigated and found to be lager for high buckling mode. The theoretical investigation on the buckling stability would give a useful reference for designing CNT as AFM probes.

scholarly journals Analysis of Vibration Frequency of Carbon Nanotubes used as Nano-Force Sensors Considering Clamped Boundary Condition

Electronics ◽  
2019 ◽  
Vol 8 (10) ◽  
pp. 1082 ◽  
Author(s):  
Toshiaki Natsuki ◽  
Kairi Urakami
Keyword(s):  
Carbon Nanotubes ◽  
Elastic Medium ◽  
Vibration Frequency ◽  
Small Diameter ◽  
Axial Direction ◽  
Force Sensor ◽  
Beam Model ◽  
Atomic Force ◽  
Buckling Stability ◽  
Euler Bernoulli Beam

Carbon nanotubes (CNTs) can be used as atomic force microscope (AFM) probes since they are ideal tip materials with a small diameter, high aspect ratio, and stiffness. In this study, a model of CNTs clamped in an elastic medium is proposed as nanoscale force sensing AFM probes. The relationship between vibration frequency and axial force of the CNT probe clamped in an elastic medium is analyzed based on the Euler-Bernoulli beam model and the Whitney-Riley model. The clamped length of CNTs, and the elastic modulus of elastic medium affect largely on the vibration and the buckling stability of a CNT AFM probe. The result showed that the sensitivity to vibration increases as the applied loads increase. The critical load in which the vibration frequency decreases rapidly, moving to large ones with decreasing ratio of length to diameter of CNTs. The theoretical investigation on the vibration frequency of CNT loaded in the axial direction would give a useful reference for designing a CNT used as a nano-force sensor.

Towards Automated Nanoassembly With the Atomic Force Microscope: A Versatile Drift Compensation Procedure

2009 ◽  
Vol 131 (6) ◽  
Author(s):  
Florian Krohs ◽  
Cagdas Onal ◽  
Metin Sitti ◽  
Sergej Fatikow
Keyword(s):  
Atomic Force Microscope ◽  
Estimation Method ◽  
Thermal Drift ◽  
Promising Technique ◽  
Drift Estimation ◽  
Atomic Force ◽  
Drift Compensation ◽  
Monte Carlo Localization ◽  
Afm Probe

While the atomic force microscope (AFM) was mainly developed to image the topography of a sample, it has been discovered as a powerful tool also for nanomanipulation applications within the last decade. A variety of different manipulation types exists, ranging from dip-pen and mechanical lithography to assembly of nano-objects such as carbon nanotubes (CNTs), deoxyribonucleic acid (DNA) strains, or nanospheres. The latter, the assembly of nano-objects, is a very promising technique for prototyping nanoelectronical devices that are composed of DNA-based nanowires, CNTs, etc. But, pushing nano-objects in the order of a few nanometers nowadays remains a very challenging, labor-intensive task that requires frequent human intervention. To increase throughput of AFM-based nanomanipulation, automation can be considered as a long-term goal. However, automation is impeded by spatial uncertainties existing in every AFM system. This article focuses on thermal drift, which is a crucial error source for automating AFM-based nanoassembly, since it implies a varying, spatial displacement between AFM probe and sample. A novel, versatile drift estimation method based on Monte Carlo localization is presented and experimental results obtained on different AFM systems illustrate that the developed algorithm is able to estimate thermal drift inside an AFM reliably even with highly unstructured samples and inside inhomogeneous environments.

Wear Characteristics of Atomic Force Microscope Probe Tips

2005 ◽  
Author(s):  
Koo-Hyun Chung ◽  
Dae-Eun Kim
Keyword(s):  
Electron Microscope ◽  
Atomic Force Microscope ◽  
Atomic Force Microscope Probe ◽  
Wear Characteristics ◽  
Atomic Force ◽  
Transmission Electron ◽  
Afm Probe ◽  
Silicon Silicon ◽  
Microscope Probe ◽  
Scanning Electron

In the field of nanotechnology, Atomic Force Microscope (AFM) which is based on the interactions between an extremely sharp probe tip and specimen, has been widely utilized. In the AFM and AFM-based applications, the probe tip wear problem should be carefully considered. In this work, the wear characteristics of silicon, silicon nitride, and diamond coated probe tip under light loads were investigated. In order to identify the structure of the AFM probe tips as well as the nature of wear, High-Resolution Transmission Electron Microscope (HRTEM) and Field Emission Scanning Electron Microscope (FESEM) analyses were utilized. Using the Archard’s wear equation, the degree of the probe tip wear was quantitatively assessed. Based on the experimental results and analysis, the plausible wear mechanisms of the AFM probe tips were proposed in an effort to understand the nano-scale wear.

Fabrication of Coaxial and Triaxial Atomic Force Microscope Imaging Probes

2014 ◽  
Vol 1712 ◽  
Author(s):  
Keith A. Brown ◽  
Robert M. Westervelt
Keyword(s):  
Atomic Force Microscope ◽  
Physical Vapor Deposition ◽  
Focused Ion Beam ◽  
Imaging Techniques ◽  
Ion Beam ◽  
Atomic Force ◽  
Imaging Probes ◽  
Microscope Imaging ◽  
Afm Probe ◽  
General Method

ABSTRACTHerein, we detail the fabrication of atomic force microscope (AFM) probes that have two and three coaxial electrodes at their tips. This fabrication strategy leverages the availability of conductive AFM probes and encompasses a general method for processing their complex and delicate structure through the deposition of insulating and conductive layers by shadow masked chemical and physical vapor deposition, respectively. Focused ion beam milling is used to expose the two electrode (coaxial) or three electrode (triaxial) structures at the tip of the AFM probe. Finally, we discuss new imaging modalities enabled by these probes including electrically-driven contact resonance imaging for nanoscale mechanical characterization, imaging the local dielectric constant by quantifying the dielectrophoretic force, and trapping functional particles at the tip of a probe using dielectrophoresis. These imaging techniques illustrate the generality and utility of this fabrication approach and suggest that such probes could be widely applied to image many nanoscale materials.

scholarly journals Determination of the critical velocity of the fluid flowing in a single-walled carbon nanotubes embedded in a polymer matrix

2019 ◽  
pp. 114-119
Author(s):  
D S Lolov ◽  
Sv V Lilkova-Markova
Keyword(s):  
Carbon Nanotubes ◽  
Elastic Medium ◽  
Polymer Matrix ◽  
Fluid Structure Interaction ◽  
Beam Model ◽  
Flowing Fluid ◽  
Fluid Structure ◽  
Structure Interaction ◽  
Single Walled Carbon ◽  
The Stability

Since 90’s carbonic nanotubes are broadly used in nanophysics, nanobiology and nanomechanics in nanofluidic devices, nanocontainers for gas storage and nanopipes conveying fluid. They have a perfect hollow cylindrical geometry and superior mechanical strength. The flowing fluid can be water, oil, dynamic flow of methane, ethane and ethylene molecules. The problem of the fluid-structure interaction could be considered in the case of nanoscale. However, the experiments at the nanoscale are difficult and expensive. That is why the continuum elastic models have been used to study the fluid-structure interaction. The carbon nanotubes are considered with Euler- and Timoshenko-beam models. In this paper the dynamic stability of a single-walled carbon nanotube is investigated on the basis of the Euler-beam model and with the employment of the Generalized Differential Quadrature Method. The tube under investigation is assumed hinged at its both ends and is embedded in a polymer matrix. To study the influence of the surrounding elastic medium (for example, a polymer) on the stability of the pipe, an elastic base of Pasternak is introduced. A differential equation is presented that describes the transverse vibrations of a nanotube embedded in a polymer matrix. Dimensionless parameters are introduced. The scheme of Chebycheva-Gauss-Lobato is used for sampling. The coefficients are calculated using Lagrange interpolation functions. A system of homogeneous equations is written in the matrix form. The obtained numerical results are for flowing fluids with different densities. In order to study the effect of the surrounding elastic medium (such as polymer) on the stability of the pipe the Pasternak elastic foundation is introduced. The critical velocities of each type of fluid are determined for different stiffnesses of this matrix. A decrease in the critical speed with the increasing mass ratio has been established.

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