Interpretations of the Thickness of Lubricant Films in Rolling Contact. 1. Examination of Measurements Obtained by X-Rays

1971 ◽  
Vol 93 (4) ◽  
pp. 478-484 ◽  
Author(s):  
J. W. Kannel ◽  
J. C. Bell
Keyword(s):  
Film Thickness ◽  
Rolling Contact ◽  
X Rays ◽  
Measuring Process ◽  
X Ray ◽  
Lubricant Films ◽  
Two Temperatures ◽  
Thickness Measurements ◽  
X Ray Absorption ◽  
Higher Sensitivity

The thickness of the film formed by each of five lubricants between a pair of disks in rolling contact has been measured by an X-ray technique for a range of loads (80,000 to 225,000 psi maximum Hertz stress), two temperatures (178 F and 250 F), and three speeds (4300 fpm to 9100 fpm). An empirical formula fitted to the X-ray data shows a much higher sensitivity of film thickness to load than is normally predicted. In order to judge whether the measurements themselves are at fault, the X-ray measuring process has been reexamined for accuracy, especially where load-dependent errors might arise. Some weaknesses are noted, such as in the amount of X-ray absorption, but these should not affect load sensitivity greatly. New experiments designed to find effects of imperfect collimation of X-rays indicate that reflection of X-rays may be significant, but these effects too do not seem to account for the anomalies of the film thickness measurements.

Interpretations of the Thickness of Lubricant Films in Rolling Contact. 2. Influence of Possible Rheological Factors

1971 ◽  
Vol 93 (4) ◽  
pp. 485-497 ◽  
Author(s):  
J. C. Bell ◽  
J. W. Kannel
Keyword(s):  
Time Delay ◽  
Film Thickness ◽  
Lubricant Film ◽  
Operating Conditions ◽  
Rolling Contact ◽  
X Rays ◽  
Load Effect ◽  
Simple Theories ◽  
Lubricant Films ◽  
Inlet Zone

Several theories involving rarely analyzed but yet realistic rheological effects have been developed in an effort to find why lubricant film thicknesses in rolling contact, as measured by X rays for rigorous operating conditions, do not obey simple theories well, especially with respect to load effect. The analysis is based on actions in the inlet zone, using the approximate geometry implied for previous simple theories. Effects investigated include a generalized pressure variation of viscosity, a non-Newtonian rheology of Ree-Eyring form, and a time delay in pressure effect on viscosity. Simple formulas are found for the influence of all these factors on lubricant film thickness. The time delay theory is found to provide the best correlation with experimental measurements of film thickness, and it is suggested to offer an attractive field for further research embracing friction effects as well as film thickness.

X-Ray absorption edge elemental imaging of B. thuringienis

1989 ◽  
Vol 47 ◽  
pp. 212-213
Author(s):  
R. L. Stears
Keyword(s):  
Absorption Edge ◽  
Elemental Distribution ◽  
X Rays ◽  
Differential Absorption ◽  
Synchrotron Source ◽  
High Brightness ◽  
X Ray ◽  
Elemental Imaging ◽  
Cellular Integrity ◽  
X Ray Absorption

Because of the nature of the bacterial endospore, little work has been done on analyzing their elemental distribution and composition in the intact, living, hydrated state. The majority of the qualitative analysis entailed intensive disruption and processing of the endospores, which effects their cellular integrity and composition.Absorption edge imaging permits elemental analysis of hydrated, unstained specimens at high resolution. By taking advantage of differential absorption of x-ray photons in regions of varying elemental composition, and using a high brightness, tuneable synchrotron source to obtain monochromatic x-rays, contact x-ray micrographs can be made of unfixed, intact endospores that reveal sites of elemental localization. This study presents new data demonstrating the application of x-ray absorption edge imaging to produce elemental information about nitrogen (N) and calcium (Ca) localization using Bacillus thuringiensis as the test specimen.

scholarly journals Al-driven peculiarities of local coordination and magnetic properties in single-phase Alx-CrFeCoNi high-entropy alloys

Nano Research ◽  
2021 ◽  
Author(s):  
Alevtina Smekhova ◽  
Alexei Kuzmin ◽  
Konrad Siemensmeyer ◽  
Chen Luo ◽  
Kai Chen ◽  
...  
Keyword(s):  
Magnetic Properties ◽  
Single Phase ◽  
Magnetic Circular Dichroism ◽  
Surface Region ◽  
Face Centered Cubic ◽  
X Rays ◽  
X Ray ◽  
High Entropy ◽  
X Ray Absorption ◽  
Absorption Edges

AbstractModern design of superior multi-functional alloys composed of several principal components requires in-depth studies of their local structure for developing desired macroscopic properties. Herein, peculiarities of atomic arrangements on the local scale and electronic states of constituent elements in the single-phase face-centered cubic (fcc)- and body-centered cubic (bcc)-structured high-entropy Alx-CrFeCoNi alloys (x = 0.3 and 3, respectively) are explored by element-specific X-ray absorption spectroscopy in hard and soft X-ray energy ranges. Simulations based on the reverse Monte Carlo approach allow to perform a simultaneous fit of extended X-ray absorption fine structure spectra recorded at K absorption edges of each 3d constituent and to reconstruct the local environment within the first coordination shells of absorbers with high precision. The revealed unimodal and bimodal distributions of all five elements are in agreement with structure-dependent magnetic properties of studied alloys probed by magnetometry. A degree of surface atoms oxidation uncovered by soft X-rays suggests different kinetics of oxide formation for each type of constituents and has to be taken into account. X-ray magnetic circular dichroism technique employed at L2.3 absorption edges of transition metals demonstrates reduced magnetic moments of 3d metal constituents in the sub-surface region of in situ cleaned fcc-structured Al0.3-CrFeCoNi compared to their bulk values. Extended to nanostructured versions of multicomponent alloys, such studies would bring new insights related to effects of high entropy mixing on low dimensions.

scholarly journals Controlling Film Thickness Distribution by Magnetron Sputtering with Rotation and Revolution

Coatings ◽  
2021 ◽  
Vol 11 (5) ◽  
pp. 599
Author(s):  
Handan Huang ◽  
Li Jiang ◽  
Yiyun Yao ◽  
Zhong Zhang ◽  
Zhanshan Wang ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
Film Thickness ◽  
Multilayer Film ◽  
Thickness Distribution ◽  
Parabolic Cylinder ◽  
Particle Model ◽  
Planetary Motion ◽  
X Rays ◽  
X Ray ◽  
Sputtering System

The laterally graded multilayer collimator is a vital part of a high-precision diffractometer. It is applied as condensing reflectors to convert divergent X-rays from laboratory X-ray sources into a parallel beam. The thickness of the multilayer film varies with the angle of incidence to guarantee every position on the mirror satisfies the Bragg reflection. In principle, the accuracy of the parameters of the sputtering conditions is essential for achieving a reliable result. In this paper, we proposed a precise method for the fabrication of the laterally graded multilayer based on a planetary motion magnetron sputtering system for film thickness control. This method uses the fast and slow particle model to obtain the particle transport process, and then combines it with the planetary motion magnetron sputtering system to establish the film thickness distribution model. Moreover, the parameters of the sputtering conditions in the model are derived from experimental inversion to improve accuracy. The revolution and rotation of the substrate holder during the final deposition process are achieved by the speed curve calculated according to the model. Measurement results from the X-ray reflection test (XRR) show that the thickness error of the laterally graded multilayer film, coated on a parabolic cylinder Si substrate, is less than 1%, demonstrating the effectiveness of the optimized method for obtaining accurate film thickness distribution.

scholarly journals Synchrotron X-ray induced acoustic imaging

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Seongwook Choi ◽  
Eun-Yeong Park ◽  
Sinyoung Park ◽  
Jong Hyun Kim ◽  
Chulhong Kim
Keyword(s):  
Acoustic Imaging ◽  
Signal Frequency ◽  
X Rays ◽  
Repetition Period ◽  
Linear Accelerators ◽  
X Ray ◽  
X Ray Computed ◽  
Medical Linear Accelerators ◽  
Ionizing Radiation Exposure ◽  
X Ray Absorption

AbstractX-ray induced acoustic imaging (XAI) is an emerging biomedical imaging technique that can visualize X-ray absorption contrast at ultrasound resolution with less ionizing radiation exposure than conventional X-ray computed tomography. So far, medical linear accelerators or industrial portable X-ray tubes have been explored as X-ray excitation sources for XAI. Here, we demonstrate the first feasible synchrotron XAI (sXAI). The synchrotron generates X-rays, with a dominant energy of 4 to 30 keV, a pulse-width of 30 ps, a pulse-repetition period of 2 ns, and a bunch-repetition period of 940 ns. The X-ray induced acoustic (XA) signals are processed in the Fourier domain by matching the signal frequency with the bunch-repetition frequency. We successfully obtained two-dimensional XA images of various lead targets. This novel sXAI tool could complement conventional synchrotron applications.

scholarly journals Semi-automated protein crystal mounting device for the sulfur single-wavelength anomalous diffraction method

2010 ◽  
Vol 43 (2) ◽  
pp. 341-346 ◽  
Author(s):  
Yu Kitago ◽  
Nobuhisa Watanabe ◽  
Isao Tanaka
Keyword(s):  
Diffraction Method ◽  
Systematic Errors ◽  
Protein Crystal ◽  
X Rays ◽  
Anomalous Diffraction ◽  
X Ray ◽  
Frozen Solution ◽  
Custom Made ◽  
Protein Molecules ◽  
X Ray Absorption

Use of longer-wavelength X-rays has advantages for the detection of small anomalous signals from light atoms, such as sulfur, in protein molecules. However, the accuracy of the measured diffraction data decreases at longer wavelengths because of the greater X-ray absorption. The capillary-top mounting method (formerly the loopless mounting method) makes it possible to eliminate frozen solution around the protein crystal and reduces systematic errors in the evaluation of small anomalous differences. However, use of this method requires custom-made tools and a large amount of skill. Here, the development of a device that can freeze the protein crystal semi-automatically using the capillary-top mounting method is described. This device can pick up the protein crystal from the crystallization drop using a micro-manipulator, and further procedures, such as withdrawal of the solution around the crystal by suction and subsequent flash freezing of the protein crystal, are carried out automatically. This device makes it easy for structural biologists to use the capillary-top mounting method for sulfur single-wavelength anomalous diffraction phasing using longer-wavelength X-rays.

scholarly journals Anisotropy of X-ray Absorption Cross Section in CeCoGe3 Single Crystal

Crystals ◽  
2021 ◽  
Vol 11 (5) ◽  
pp. 544
Author(s):  
Andrei Rogalev ◽  
Fabrice Wilhelm ◽  
Elena Ovchinnikova ◽  
Aydar Enikeev ◽  
Roman Bakonin ◽  
...  
Keyword(s):  
Cross Section ◽  
Absorption Cross Section ◽  
Linear Dichroism ◽  
X Rays ◽  
Absorption Cross ◽  
X Ray ◽  
Measured Absorption ◽  
Linearly Polarized ◽  
X Ray Absorption ◽  
Absorption Edges

Absorption spectra of two orthogonal linearly polarized x-rays in a single CeCoGe3 crystal were measured at the ID12 beamline of the ESRF for the energies near the K-edges of Ge, Co and near the L23 edges of Ce. The X-ray natural linear dichroism (XNLD) was revealed in the vicinity of all the absorption edges, which indicates a splitting of electronic states in a crystalline field. Mathematical modelling in comparison with experimental data allowed the isotropic and anisotropic parts of atomic absorption cross section in CeCoGe3 to be determined near all measured absorption edges. The calculations also show that the “average” anisotropy of the cross section close to the Ge K-edge revealed in the experiment is less than the partial anisotropic contributions corresponding to Ge atoms in two different Wyckoff positions.

X–ray absorption fine structure (XAFS) of Si wafer measured using total reflection X–rays

1999 ◽  
Vol 54 (1) ◽  
pp. 215-222 ◽  
Author(s):  
Jun Kawai ◽  
Shinjiro Hayakawa ◽  
Yoshinori Kitajima ◽  
Yohichi Gohshi
Keyword(s):  
Fine Structure ◽  
Total Reflection ◽  
X Rays ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption ◽  
Si Wafer

A single crystal, linearly polarized Fe 2p X-ray absorption study of gillespite

1998 ◽  
Vol 62 (1) ◽  
pp. 65-75 ◽  
Author(s):  
P. F. Schofield ◽  
G. van der Laan ◽  
C. M. B. Henderson ◽  
G. Cressey
Keyword(s):  
Single Crystal ◽  
Ground State ◽  
Branching Ratio ◽  
Linear Dichroism ◽  
Electronic Charge ◽  
Magic Angle ◽  
X Rays ◽  
X Ray ◽  
Peak Structure ◽  
X Ray Absorption

AbstractThe Fe 2p X-ray absorption spectra of single crystal gillespite, BaFeSi4O10, show a strong linear dichroism, i.e. a large difference in the absorption when measured with the polarization of the X-rays either parallel or perpendicular to the plane of the FeO4 group. The isotropic spectrum, obtained from measurement at the ‘magic angle’, and the polarization dependent spectra have been compared to atomic multiplet calculations and show an excellent agreement with theory. Analysis of the branching ratio, the linear dichroism, and the detailed peak structure confirms that the 5A1 level is the ground state at room temperature and pressure. The 5B2 level is sufficiently low in energy that a distortion of the electronic charge density, induced by increased pressure, may result in a 5B2 ground state.

Detection of a metallic glass layer by x-ray diffraction

1986 ◽  
Vol 1 (5) ◽  
pp. 629-634 ◽  
Author(s):  
J.W. McCamy ◽  
M.J. Godbole ◽  
A.J. Pedraza ◽  
D.H. Lowndes
Keyword(s):  
Target Material ◽  
Amorphous Layer ◽  
Glass Layer ◽  
X Rays ◽  
Average Thickness ◽  
X Ray Diffraction ◽  
Near Surface ◽  
X Ray ◽  
Integrated Intensity ◽  
Thickness Measurements

A simple, precise method for obtaining the average thickness of an amorphous layer formed by any surface treatment has been developed. The technique uses an x-ray diffractoeter to measure the reduction in the integrated intensity of several diffracted x-ray lines due to the near surface amorphous layer. The target material for generation of x rays is selected so that the emitted x rays are strongly absorbed by the specimen. This method permits thickness measurements down to ∼ 100 nm. It has been tested on a specimen of Fe80B20 on which an amorphous layer was produced by pulsed XeCl (308 nm) laser irradiation; the amorphous layer thickness was found to be 1.34 (∼0.1) um.

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