scholarly journals Anisotropy of X-ray Absorption Cross Section in CeCoGe3 Single Crystal

Crystals ◽  
2021 ◽  
Vol 11 (5) ◽  
pp. 544
Author(s):  
Andrei Rogalev ◽  
Fabrice Wilhelm ◽  
Elena Ovchinnikova ◽  
Aydar Enikeev ◽  
Roman Bakonin ◽  
...  
Keyword(s):  
Cross Section ◽  
Absorption Cross Section ◽  
Linear Dichroism ◽  
X Rays ◽  
Absorption Cross ◽  
X Ray ◽  
Measured Absorption ◽  
Linearly Polarized ◽  
X Ray Absorption ◽  
Absorption Edges

Absorption spectra of two orthogonal linearly polarized x-rays in a single CeCoGe3 crystal were measured at the ID12 beamline of the ESRF for the energies near the K-edges of Ge, Co and near the L23 edges of Ce. The X-ray natural linear dichroism (XNLD) was revealed in the vicinity of all the absorption edges, which indicates a splitting of electronic states in a crystalline field. Mathematical modelling in comparison with experimental data allowed the isotropic and anisotropic parts of atomic absorption cross section in CeCoGe3 to be determined near all measured absorption edges. The calculations also show that the “average” anisotropy of the cross section close to the Ge K-edge revealed in the experiment is less than the partial anisotropic contributions corresponding to Ge atoms in two different Wyckoff positions.

Multiple Scattering Calculations Applied to XAS: A Structure and Electronic Sensitive Tool

1991 ◽  
Vol 253 ◽  
Author(s):  
Philippe Sainctavit ◽  
J. Petiau
Keyword(s):  
Multiple Scattering ◽  
Cross Section ◽  
Absorption Cross Section ◽  
Scattering Theory ◽  
Spectral Features ◽  
Absorption Cross ◽  
Multiple Scattering Theory ◽  
X Ray ◽  
Sensitive Tool ◽  
X Ray Absorption

ABSTRACTWe present an application of multiple scattering theory with “muffin-tin” potentials to the calculation of X-ray absorption cross section. We have measured and calculated the K-edge spectra of atoms in compounds with zincblende structure : SiC, ZnS. We show that some spectral features can be precisely related to the local environnement around the absorbing atom.

Fluorescence yield detection: Why it does not measure the X-ray absorption cross section

1994 ◽  
Vol 92 (12) ◽  
pp. 991-995 ◽  
Author(s):  
F.M.F. de Groot ◽  
M.A. Arrio ◽  
Ph. Sainctavit ◽  
Ch. Cartier ◽  
C.T. Chen
Keyword(s):  
Cross Section ◽  
Absorption Cross Section ◽  
Fluorescence Yield ◽  
Absorption Cross ◽  
X Ray ◽  
X Ray Absorption

Elemental, chemical, and orientational characterization of easily damageable materials with x-ray microscopy

1995 ◽  
Vol 53 ◽  
pp. 92-93
Author(s):  
H. Ade
Keyword(s):  
Linear Dichroism ◽  
Aqueous Environment ◽  
X Rays ◽  
Edge Structure ◽  
X Ray ◽  
Elemental Sensitivity ◽  
Linearly Polarized ◽  
Synchrotron Light ◽  
X Ray Absorption

Many of the transmission x-ray microscopy developments since the late seventies, including the ones at the National Synchrotron Light Source (NSLS), were driven primarily by the potential of x-ray microscopy to image wet and unstained biological samples with low radiation dose. High image contrast between an aqueous environment and carbon based materials can be achieved with photon energies between the carbon and oxygen K absorption edges (290-540 eV). This contrast is based on differences in cross section of the elements oxygen and carbon in this energy range. Going beyond this "elemental" sensitivity, Ade et al. recently demonstrated how chemical (valence) sensitivity can be achieved via the X-ray Absorption Near Edge Structure (XANES) at the carbon K edge. In addition, linear dichroism microscopy can exploit the dependence of x-ray absorption resonances on the bond orientation relative to the linearly polarized x rays. For an application of the latter technique see A.P. Smith et al.

X-ray microscopy: A novel, low damage approach to core excitation spectroscopy at high spatial resolution

1996 ◽  
Vol 54 ◽  
pp. 156-157
Author(s):  
H. Ade
Keyword(s):  
Linear Dichroism ◽  
X Rays ◽  
Chemical Mapping ◽  
Specific Chemical ◽  
X Ray ◽  
Nexafs Spectroscopy ◽  
Linearly Polarized ◽  
Imaging Mode ◽  
Electron Energy Loss ◽  
X Ray Absorption

Only recently has transmission x-ray microscopy been utilized for chemical analysis from small spots and chemical mapping via near edge x-ray absorption fine structure (NEXAFS) spectroscopy. NEXAFS microscopy is analogous to Electron Energy Loss Spectroscopy (EELS) in an electron microscope. Particularly in imaging mode, NEXAFS microscopy requires a considerable lower dose than EELS microscopy which makes it very suitable to studying radiation sensitive materials such as polymers. In addition, NEXAFS microscopy can exploit the dependence of x-ray absorption resonances on the bond orientation relative to the linearly polarized x rays (linear dichroism microscopy) and determine the orientation of specific chemical bonds in (partially) orientated materials.

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