scholarly journals Ultra‐reduced phases in Apollo 16 regolith: Combined field emission electron probe microanalysis and atom probe tomography of submicron Fe‐Si grains in Apollo 16 sample 61500

2017 ◽  
Vol 52 (9) ◽  
pp. 1941-1962 ◽  
Author(s):  
Phillip Gopon ◽  
Michael J. Spicuzza ◽  
Thomas F. Kelly ◽  
David Reinhard ◽  
Ty J. Prosa ◽  
...  
Keyword(s):  
Field Emission ◽  
Electron Probe Microanalysis ◽  
Atom Probe Tomography ◽  
Electron Probe ◽  
Atom Probe ◽  
Emission Electron

Observation of Fine Distribution of Minor Dopants in an Erbium-Doped Fiber Core using a Sample Thinning Technique for Field Emission Electron Probe Microanalysis

2015 ◽  
Vol 21 (6) ◽  
pp. 1398-1405 ◽  
Author(s):  
Yugo Kubo ◽  
Koji Kuramochi
Keyword(s):  
Field Emission ◽  
Electron Probe Microanalysis ◽  
Electron Probe ◽  
Optical Amplifier ◽  
Beam Radiation ◽  
X Ray ◽  
Electron Beam Radiation ◽  
Emission Electron ◽  
Erbium Doped ◽  
Main Component

AbstractTo observe the fine distribution of minor aluminum and germanium dopants in the erbium-doped fiber (EDF) core of an optical amplifier, a sample thinning technique was applied for field emission electron probe microanalysis (FE-EPMA) together with wavelength-dispersive X-ray spectrometry. This technique significantly improved the spatial resolution without much degradation of the minimum detection limit for FE-EPMA. As such, this enabled us to observe the distribution of minor dopants in EDF. Moreover, we propose a very simple sample preparation to prevent electron-beam radiation damage, a problem involved with FE-EPMA of low-conductivity materials such as SiO2 glass, which is the main component of EDF.

THE ATOM-PROBE WITH A FIELD EMISSION ELECTRON SPECTROMETER

1989 ◽  
Vol 50 (C8) ◽  
pp. C8-507-C8-512
Author(s):  
O. NISHIKAWA ◽  
H. KOYAMA ◽  
N. KODAMA ◽  
M. TOMITORI
Keyword(s):  
Field Emission ◽  
Atom Probe ◽  
Electron Spectrometer ◽  
Emission Electron

scholarly journals Reconstruction Method for Atom Probe Tomography by Using Field Emission Microscopy

2016 ◽  
Vol 14 (0) ◽  
pp. 189-192
Author(s):  
Yun Kim ◽  
Tsuyoshi Yukawa ◽  
Daichi Shirakura ◽  
Masato Morita ◽  
Masanori Owari
Keyword(s):  
Field Emission ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Reconstruction Method ◽  
Field Emission Microscopy ◽  
Emission Microscopy

Atom-probe and field emission electron spectroscope studies of Ge on Ir

1993 ◽  
Vol 67 (1-4) ◽  
pp. 43-47 ◽  
Author(s):  
Makoto Ashino ◽  
Masahiko Tomitori ◽  
Osamu Nishikawa
Keyword(s):  
Field Emission ◽  
Atom Probe ◽  
Emission Electron
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