THE ATOM-PROBE WITH A FIELD EMISSION ELECTRON SPECTROMETER

1989 ◽  
Vol 50 (C8) ◽  
pp. C8-507-C8-512
Author(s):  
O. NISHIKAWA ◽  
H. KOYAMA ◽  
N. KODAMA ◽  
M. TOMITORI
Keyword(s):  
Field Emission ◽  
Atom Probe ◽  
Electron Spectrometer ◽  
Emission Electron

Atom-probe and field emission electron spectroscope studies of Ge on Ir

1993 ◽  
Vol 67 (1-4) ◽  
pp. 43-47 ◽  
Author(s):  
Makoto Ashino ◽  
Masahiko Tomitori ◽  
Osamu Nishikawa
Keyword(s):  
Field Emission ◽  
Atom Probe ◽  
Emission Electron

Observation of Phase Contrast Images in STEM and CTEM Modes by Using 100 kV Field Emission Electron Gun

1974 ◽  
Vol 32 ◽  
pp. 390-391
Author(s):  
Y. Harada ◽  
T. Goto ◽  
H. Koike ◽  
T. Someya
Keyword(s):  
Field Emission ◽  
Phase Contrast ◽  
Image Formation ◽  
Fresnel Diffraction ◽  
Experimental Results ◽  
Electron Gun ◽  
Scanning Microscopy ◽  
Emission Electron ◽  
Lattice Images

Since phase contrasts of STEM images, that is, Fresnel diffraction fringes or lattice images, manifest themselves in field emission scanning microscopy, the mechanism for image formation in the STEM mode has been investigated and compared with that in CTEM mode, resulting in the theory of reciprocity. It reveals that contrast in STEM images exhibits the same properties as contrast in CTEM images. However, it appears that the validity of the reciprocity theory, especially on the details of phase contrast, has not yet been fully proven by the experiments. In this work, we shall investigate the phase contrast images obtained in both the STEM and CTEM modes of a field emission microscope (100kV), and evaluate the validity of the reciprocity theory by comparing the experimental results.

Characteristics and Application of Temperature-Field Emitters

1975 ◽  
Vol 33 ◽  
pp. 144-145
Author(s):  
N. Tamura ◽  
T. Goto ◽  
Y. Harada
Keyword(s):  
Temperature Field ◽  
Electron Microscope ◽  
Field Emission ◽  
Resolving Power ◽  
High Brightness ◽  
Field Emitters ◽  
Emission Electron ◽  
Sufficient Stability ◽  
Scanning Electron ◽  
Illuminating System

On account of its high brightness, the field emission electron source has the advantage that it provides the conventional electron microscope with highly coherent illuminating system and that it directly improves the, resolving power of the scanning electron microscope. The present authors have reported some results obtained with a 100 kV field emission electron microscope.It has been proven, furthermore, that the tungsten emitter as a temperature field emission source can be utilized with a sufficient stability under a modest vacuum of 10-8 ~ 10-9 Torr. The present paper is concerned with an extension of our study on the characteristics of the temperature field emitters.

The development of a 200kV monochromated field emission electron source

2014 ◽  
Vol 140 ◽  
pp. 37-43 ◽  
Author(s):  
Masaki Mukai ◽  
Judy S. Kim ◽  
Kazuya Omoto ◽  
Hidetaka Sawada ◽  
Atsushi Kimura ◽  
...  
Keyword(s):  
Field Emission ◽  
Electron Source ◽  
Emission Electron

Silicon Field Emission Electron Source With Individually Controllable Single Emitters

2021 ◽  
pp. 1-7
Author(s):  
Robert Lawrowski ◽  
Matthias Hausladen ◽  
Philipp Buchner ◽  
Rupert Schreiner
Keyword(s):  
Field Emission ◽  
Electron Source ◽  
Emission Electron
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