High‐resolution optical microscopy for characterising microstructural deformation in microtensile testing

2020 ◽  
Author(s):  
J. WANNI ◽  
J. G. MICHOPOULOS ◽  
A. BAGCHI ◽  
S. BANERJEE ◽  
N. BANERJEE ◽  
...  
Keyword(s):  
High Resolution ◽  
Optical Microscopy ◽  
Microtensile Testing ◽  
Microstructural Deformation

scholarly journals Near-Field Scanning Optical Microscopy for High-Resolution Membrane Studies

Nanoimaging ◽  
2012 ◽  
pp. 373-394 ◽  
Author(s):  
Heath A. Huckabay ◽  
Kevin P. Armendariz ◽  
William H. Newhart ◽  
Sarah M. Wildgen ◽  
Robert C. Dunn
Keyword(s):  
High Resolution ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

High-Resolution Optical Microscopy of Gas Hydrates

2017 ◽  
pp. 113-144 ◽  
Author(s):  
Nelly Hobeika ◽  
Maria Lourdes Martinez De Baños ◽  
Patrick Bouriat ◽  
Daniel Broseta ◽  
Ross Brown
Keyword(s):  
High Resolution ◽  
Optical Microscopy ◽  
Gas Hydrates

Study of Triangle-Shaped Defects on Nearly On-Axis 4H-SiC Substrates

2016 ◽  
Vol 858 ◽  
pp. 225-228 ◽  
Author(s):  
Ren Wei Zhou ◽  
Xue Chao Liu ◽  
Hui Jun Guo ◽  
H.K. Kong ◽  
Er Wei Shi
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Raman Spectroscopy ◽  
High Resolution ◽  
Optical Microscopy ◽  
Epitaxial Growth ◽  
Surface Defects ◽  
Micro Raman Spectroscopy ◽  
Transmission Electron

Triangle-shaped defects are one of the most common surface defects on epitaxial growth of 4H-SiC epilayer on nearly on-axis SiC substrate. In this paper, we investigate the feature and structure of such defects using Nomarski optical microscopy (NOM), micro-Raman spectroscopy and high resolution transmission electron microscopy (HR-TEM). It is found that triangle-shaped defects were composed of a thick 3C-SiC polytype, as well as 4H-SiC epilayer.

2,2′-Thiodiethanol: A new water soluble mounting medium for high resolution optical microscopy

2006 ◽  
Vol 70 (1) ◽  
pp. 1-9 ◽  
Author(s):  
Thorsten Staudt ◽  
Marion C. Lang ◽  
Rebecca Medda ◽  
Johann Engelhardt ◽  
Stefan W. Hell
Keyword(s):  
High Resolution ◽  
Optical Microscopy ◽  
Water Soluble

Near-field scattering optical microscopy probes for high-resolution beam scans of near-infrared lasers and waveguides

1998 ◽  
Author(s):  
Roderick S. Taylor ◽  
Kurt E. Leopold ◽  
Jeffrey W. Fraser ◽  
Yan Feng ◽  
Margaret Buchanan
Keyword(s):  
High Resolution ◽  
Optical Microscopy ◽  
Near Infrared ◽  
Near Field ◽  
Infrared Lasers
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