Multiple parametric nanoscale measurements with high sensitivity based on through‐focus scanning optical microscopy

2019 ◽  
Vol 274 (3) ◽  
pp. 139-149
Author(s):  
R. PENG ◽  
Y. QU ◽  
J. HAO ◽  
H. PAN ◽  
J. NIU ◽  
...  
1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen

1995 ◽  
Vol 61 (1-4) ◽  
pp. 291-294 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan Kämmer ◽  
Karsten Walzer ◽  
Michael Hietschold

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