Effect of microscope parameter and specimen thickness of spatial resolution of transmission electron backscatter diffraction

2016 ◽  
Vol 264 (1) ◽  
pp. 34-40 ◽  
Author(s):  
Y.Z. WANG ◽  
M.G. KONG ◽  
Z.W. LIU ◽  
C.C. LIN ◽  
Y. ZENG
Keyword(s):  
Spatial Resolution ◽  
Electron Backscatter Diffraction ◽  
Specimen Thickness ◽  
Transmission Electron ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Where are the geometrically necessary dislocations accommodating small imprints?

2009 ◽  
Vol 24 (3) ◽  
pp. 647-651 ◽  
Author(s):  
M. Rester ◽  
C. Motz ◽  
R. Pippan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Twin Boundary ◽  
Crystal Orientation ◽  
Electron Backscatter Diffraction ◽  
Transmission Electron ◽  
Electron Backscatter ◽  
Copper Single Crystals ◽  
Backscatter Diffraction ◽  
Small Misorientation

Electron backscatter diffraction (EBSD) and transmission electron microscopy (TEM) analyses of small indentations in copper single crystals exhibit only slight changes of the crystal orientation in the surroundings of the imprints. Far-reaching dislocations might be the reason for these small misorientation changes. Using EBSD and TEM technique, this work makes an attempt to visualize the far-propagating dislocations by introducing a twin boundary in the vicinity of small indentations. Because dislocations piled up at the twin boundary produce a misorientation gradient, the otherwise far-propagating dislocations can be detected.

Heteroepitaxy of Ge on Cube-Textured Ni(001) Foils Through CaF2 Buffer Layer

MRS Advances ◽  
2016 ◽  
Vol 1 (43) ◽  
pp. 2947-2952
Author(s):  
L. Chen ◽  
Z.-H. Lu ◽  
T.-M. Lu ◽  
I. Bhat ◽  
S.B. Zhang ◽  
...  
Keyword(s):  
Buffer Layer ◽  
High Efficiency ◽  
Electron Backscatter Diffraction ◽  
Low Cost ◽  
High Quality ◽  
Tem Analysis ◽  
Transmission Electron ◽  
Electron Backscatter ◽  
Image Position ◽  
Backscatter Diffraction

ABSTRACTEpitaxial Ge films are useful as a substrate for high-efficiency solar cell applications. It is possible to grow epitaxial Ge films on low cost, cube textured Ni(001) sheets using CaF2(001) as a buffer layer. Transmission electron microscopy (TEM) analysis indicates that the CaF2(001) lattice has a 45o in-plane rotation relative to the Ni(001) lattice. The in-plane epitaxy relationships are CaF2[110]//Ni[100] and CaF2[$\bar 1$10]//Ni[010]. Energy dispersive spectroscopy (EDS) shows a sharp interface between Ge/CaF2 as well as between CaF2/Ni. Electron backscatter diffraction (EBSD) shows that the Ge(001) film has a large grain size (∼50 μm) with small angle grain boundaries (< 8o). The epitaxial Ge thin film has the potential to be used as a substrate to grow high quality III-V and II-VI semiconductors for optoelectronic applications.

scholarly journals Coupling Automated Electron Backscatter Diffraction with Transmission Electron and Atomic Force Microscopies

2000 ◽  
Vol 6 (S2) ◽  
pp. 940-941
Author(s):  
A.J. Schwartz ◽  
M. Kumar ◽  
P.J. Bedrossian ◽  
W.E. King
Keyword(s):  
Grain Boundary ◽  
Grain Boundaries ◽  
Thermomechanical Processing ◽  
Electron Backscatter Diffraction ◽  
Grain Boundary Character Distribution ◽  
Atomic Force ◽  
Transmission Electron ◽  
Electron Backscatter ◽  
Network Engineering ◽  
Backscatter Diffraction

Grain boundary network engineering is an emerging field that encompasses the concept that modifications to conventional thermomechanical processing can result in improved properties through the disruption of the random grain boundary network. Various researchers have reported a correlation between the grain boundary character distribution (defined as the fractions of “special” and “random” grain boundaries) and dramatic improvements in properties such as corrosion and stress corrosion cracking, creep, etc. While much early work in the field emphasized property improvements, the opportunity now exists to elucidate the underlying materials science of grain boundary network engineering. Recent investigations at LLNL have coupled automated electron backscatter diffraction (EBSD) with transmission electron microscopy (TEM)5 and atomic force microscopy (AFM) to elucidate these fundamental mechanisms.An example of the coupling of TEM and EBSD is given in Figures 1-3. The EBSD image in Figure 1 reveals “segmentation” of boundaries from special to random and random to special and low angle grain boundaries in some grains, but not others, resulting from the 15% compression of an Inconel 600 polycrystal.

scholarly journals Transmission Electron Backscatter Diffraction (tEBSD) analysis of Au Thin Films

2015 ◽  
Vol 21 (S3) ◽  
pp. 1671-1672
Author(s):  
Eliot Estrine ◽  
Nicholas Seaton ◽  
Prabesh Dulal ◽  
Bethanie Stadler
Keyword(s):  
Thin Films ◽  
Electron Backscatter Diffraction ◽  
Transmission Electron ◽  
Electron Backscatter ◽  
Au Thin Films ◽  
Backscatter Diffraction

Formation of Nanoporous Gold Studied by Transmission Electron Backscatter Diffraction

2015 ◽  
Vol 21 (6) ◽  
pp. 1387-1397 ◽  
Author(s):  
Leo T.H. de Jeer ◽  
Diego Ribas Gomes ◽  
Jorrit E. Nijholt ◽  
Rik van Bremen ◽  
Václav Ocelík ◽  
...  
Keyword(s):  
Crystallographic Texture ◽  
Manufacturing Process ◽  
Electron Backscatter Diffraction ◽  
Nanoporous Materials ◽  
Nanoporous Gold ◽  
Grain Structure ◽  
Misorientation Distribution ◽  
Transmission Electron ◽  
Electron Backscatter ◽  
Backscatter Diffraction

AbstractTransmission electron backscatter diffraction (t-EBSD) was used to investigate the effect of dealloying on the microstructure of 140-nm thin gold foils. Statistical and local comparisons of the microstructure between the nonetched and nanoporous gold foils were made. Analyses of crystallographic texture, misorientation distribution, and grain structure clearly prove that during the dealloying manufacturing process of nanoporous materials the crystallographic texture is enhanced significantly with a clear decrease of internal strain, whereas maintaining the grain structure.

scholarly journals Dislocation Creep of Olivine and Amphibole in Amphibole Peridotites from Åheim, Norway

Minerals ◽  
2021 ◽  
Vol 11 (9) ◽  
pp. 1018
Author(s):  
Sejin Jung ◽  
Takafumi Yamamoto ◽  
Jun-ichi Ando ◽  
Haemyeong Jung
Keyword(s):  
Electron Microscopy ◽  
Slip System ◽  
Electron Backscatter Diffraction ◽  
Microstructural Analysis ◽  
Dislocation Creep ◽  
Transmission Electron ◽  
Electron Backscatter ◽  
Different Types ◽  
Localized Shear Deformation ◽  
Backscatter Diffraction

Amphibole peridotite samples from Åheim, Norway, were analyzed to understand the deformation mechanism and microstructural evolution of olivine and amphibole through the Scandian Orogeny and subsequent exhumation process. Three Åheim amphibole peridotite samples were selected for detailed microstructural analysis. The Åheim amphibole peridotites exhibit porphyroclastic texture, abundant subgrain boundaries in olivine, and the evidence of localized shear deformation in the tremolite-rich layer. Two different types of olivine lattice preferred orientations (LPOs) were observed: B- and A-type LPOs. Electron backscatter diffraction (EBSD) mapping and transmission electron microscopy (TEM) observations revealed that most subgrain boundaries in olivine consist of dislocations with a (001)[100] slip system. The subgrain boundaries in olivine may have resulted from the deformation of olivine with moderate water content. In addition, TEM observations using a thickness-fringe method showed that the free dislocations of olivine with the (010)[100] slip system were dominant in the peridotites. Our data suggest that the subgrain boundaries and free dislocations in olivine represent a product of later-stage deformation associated with the exhumation process. EBSD mapping of the tremolite-rich layer revealed intracrystalline plasticity in amphibole, which can be interpreted as the activation of the (100)[001] slip system.

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