Temperature‐dependent electrical transport behavior and structural evolution in hollandite‐type titanium‐based oxide

2019 ◽  
Vol 102 (11) ◽  
pp. 6741-6750 ◽  
Author(s):  
Tao Feng ◽  
Liping Li ◽  
Zhe Lv ◽  
Baoyun Li ◽  
Yuelan Zhang ◽  
...  
2016 ◽  
Vol 34 (2) ◽  
pp. 399-403 ◽  
Author(s):  
Jabril A. Khamaj

AbstractIn this article, the influence of ion irradiation on temperature dependent electrical transport characteristics of thin graphite flakes was investigated. Thin graphite flakes were exfoliated by mechanical exfoliation method. Scanning electron microscopy was used to study surface morphology of the graphite flakes. The resistance versus temperature studies revealed that the graphite flake not subjected to Ga+ ion-irradiation showed a perfect metallic behavior, while the graphite flake after ion-irradiation showed a semiconducting behavior. The current-voltage (I-V) characteristics of bare and ion-irradiated graphite flakes were investigated. The bare graphite flake showed an ohmic-type I-V characteristics representing metallic behavior, while the ion-irradiated graphite flake showed a non-linear type diode-like characteristics. The temperature-dependent conductance measurements of ion-irradiated graphite flake were also performed and discussed in detail. The effect of Ga+ ions on the electronic transport behavior of thin graphite flakes has been discussed based on the investigation results.


2011 ◽  
Vol 109 (4) ◽  
pp. 044502-044502-5 ◽  
Author(s):  
Basanta Roul ◽  
Mohana K. Rajpalke ◽  
Thirumaleshwara N. Bhat ◽  
Mahesh Kumar ◽  
Neeraj Sinha ◽  
...  

2014 ◽  
Vol 590 ◽  
pp. 184-192 ◽  
Author(s):  
B. Daruka Prasad ◽  
H. Nagabhushana ◽  
K. Thyagarajan ◽  
B.M. Nagabhushana ◽  
D.M. Jnaneshwara ◽  
...  

2021 ◽  
Vol 121 ◽  
pp. 106749
Author(s):  
Seema Thakur ◽  
Vanita Thakur ◽  
Anumeet Kaur ◽  
Lakhwant Singh

2015 ◽  
Vol 12 (5) ◽  
pp. 780-785
Author(s):  
San-Lin Young ◽  
Ming-Cheng Kao ◽  
Hone-Zern Chen ◽  
Neng-Fu Shih ◽  
Chung-Yuan Kung ◽  
...  

2011 ◽  
Vol 679-680 ◽  
pp. 797-800 ◽  
Author(s):  
Sushant Sonde ◽  
Carmelo Vecchio ◽  
Filippo Giannazzo ◽  
Corrado Bongiorno ◽  
Salvatore di Franco ◽  
...  

In this study we examined the structural evolution of graphene grown on 8° off-axis 4H-SiC(0001) substrates at temperatures from 1600°C to 1700°C in Ar ambient. Morphological transformation of SiC substrate after annealing was examined by Tapping Mode Atomic Force Microscopy. Moreover, by etching-out graphene layers from graphitized SiC substrates in selective trenches we determined the number of graphene layers. Numbers of graphene layers were then independently confirmed by Transmission Electron Microscopy imaging.


2D Materials ◽  
2014 ◽  
Vol 1 (1) ◽  
pp. 011008 ◽  
Author(s):  
Baleeswaraiah Muchharla ◽  
T N Narayanan ◽  
Kaushik Balakrishnan ◽  
Pulickel M Ajayan ◽  
Saikat Talapatra

2021 ◽  
Vol 26 ◽  
pp. 101930
Author(s):  
Anusuya T. ◽  
Prakash J. ◽  
Devesh K. Pathak ◽  
Kapil Saxena ◽  
Rajesh Kumar ◽  
...  

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