Eu-substitution-induced commensurate phase with enhanced ferroelectric property in Ba4 (Eu x La1−x )2 Fe2 Nb8 O30 multiferroics

2018 ◽  
Vol 102 (4) ◽  
pp. 1748-1757 ◽  
Author(s):  
Jiang Sheng Hong ◽  
Yu Hui Huang ◽  
Yong Jun Wu ◽  
Mao Sen Fu ◽  
Juan Li ◽  
...  
1982 ◽  
Vol 43 (5) ◽  
pp. 755-759 ◽  
Author(s):  
M. Bertault ◽  
M. Krauzman ◽  
M. Le Postollec ◽  
R.M. Pick ◽  
M. Schott

2004 ◽  
Vol 830 ◽  
Author(s):  
Hiroshi Nakaki ◽  
Hiroshi Uchida ◽  
Shoji Okamoto ◽  
Shintaro Yokoyama ◽  
Hiroshi Funakubo ◽  
...  

ABSTRACTRare-earth-substituted tetragonal lead zirconate titanate thin films were synthesized for improving the ferroelectric property of conventional lead zirconate titanate. Thin films of Pb1.00REx (Zr0.40Ti0.60)1-(3x /4)O3 (x = 0.02, RE = Y, Dy, Er and Yb) were deposited on (111)Pt/Ti/SiO2/(100)Si substrates by a chemical solution deposition (CSD). B-site substitution using rare-earth cations described above enhanced the crystal anisotropy, i.e., ratio of PZT lattice parameters c/a. Remanent polarization (Pr) of PZT film was enhanced by Y3+-, Dy3+- and Er3+-substitution from 20 μC/cm2 up to 26, 25 and 26 μC/cm2 respectively, while ion substitution using Yb3+ degraded the Pr value down to 16 μC/cm2. These films had similar coercive fields (Ec) of around 100 kV/cm. Improving the ferroelectric property of PZT film by rare-earth-substitution would be ascribed to the enhancement of the crystal anisotropy. We concluded that ion substitution using some rare-earth cations, such as Y3+, Dy3+ or Er3+, is one of promising technique for improving the ferroelectric property of PZT film.


2010 ◽  
Vol 17 (05n06) ◽  
pp. 445-449 ◽  
Author(s):  
SUHUA FAN ◽  
QUANDE CHE ◽  
FENGQING ZHANG

The (100)-oriented Ca0.4Sr0.6Bi4Ti4O15(C0.4S0.6BTi ) thin film was successfully prepared by a sol-gel method on Pt/Ti/SiO2/Si substrate. The orientation and formation of thin films under different annealing schedules were studied using XRD and SEM. XRD analysis indicated that (100)-oriented C0.4S0.6BTi thin film with degree of orientation of I(200)/I(119) = 1.60 was prepared by preannealing the film at 400°C for 3 min followed by rapid thermal annealing at 800°C for 5 min. SEM analysis further indicated that the (100)-oriented C0.4S0.6BTi thin film with a thickness of about 800 nm was mainly composed of equiaxed grains. The remanent polarization and coercive field of the film were 16.1 μC/cm2 and 85 kV/cm, respectively.


2006 ◽  
Vol 300 (1) ◽  
pp. e437-e439 ◽  
Author(s):  
A.G. Zhdanov ◽  
T.B. Kosykh ◽  
A.P. Pyatakov ◽  
A.K. Zvezdin ◽  
D. Viehland

1997 ◽  
Vol 70 (15) ◽  
pp. 1971-1973 ◽  
Author(s):  
Yung Park ◽  
Ho-Gi Kim

2016 ◽  
Vol 57 (3) ◽  
pp. 278-282 ◽  
Author(s):  
Takashi Fukuda ◽  
Gakudai Yamasaki ◽  
Hiroaki Yoshinobu ◽  
Tomoyuki Kakeshita

2007 ◽  
Vol 253 (14) ◽  
pp. 6222-6225 ◽  
Author(s):  
Jiagang Wu ◽  
Jiliang Zhu ◽  
Dingquan Xiao ◽  
Jianguo Zhu ◽  
Junzhe Tan ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document