scholarly journals Super-resolution characterization of TCR-dependent signaling clusters

2012 ◽  
Vol 251 (1) ◽  
pp. 21-35 ◽  
Author(s):  
Eilon Sherman ◽  
Valarie Barr ◽  
Lawrence E. Samelson
Keyword(s):  
2021 ◽  
Vol 120 (3) ◽  
pp. 9a
Author(s):  
Dushyant Mehra ◽  
Chiranjib Banerjee ◽  
Santosh Adhikari ◽  
Jacob M. Ritz ◽  
Angel Mancebo ◽  
...  

Polymers ◽  
2020 ◽  
Vol 12 (5) ◽  
pp. 1142 ◽  
Author(s):  
Phuong Nguyen-Tri ◽  
Payman Ghassemi ◽  
Pascal Carriere ◽  
Sonil Nanda ◽  
Aymen Amine Assadi ◽  
...  

Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. This paper reviews some recent progress in the application of AFM and AFM-IR in polymer science. We describe the principle of AFM-IR and the recent improvements to enhance its resolution. We also discuss the latest progress in the use of AFM-IR as a super-resolution correlated scanned-probe infrared spectroscopy for the chemical characterization of polymer materials dealing with polymer composites, polymer blends, multilayers, and biopolymers. To highlight the advantages of AFM-IR, we report several results in studying the crystallization of both miscible and immiscible blends as well as polymer aging. Finally, we demonstrate how this novel technique can be used to determine phase separation, spherulitic structure, and crystallization mechanisms at nanoscales, which has never been achieved before. The review also discusses future trends in the use of AFM-IR in polymer materials, especially in polymer thin film investigation.


2017 ◽  
Vol 56 (22) ◽  
pp. 6131-6135 ◽  
Author(s):  
Anne Burgert ◽  
Jan Schlegel ◽  
Jérôme Bécam ◽  
Sören Doose ◽  
Erhard Bieberich ◽  
...  

ACS Nano ◽  
2015 ◽  
Vol 9 (9) ◽  
pp. 9158-9166 ◽  
Author(s):  
Lydia Kisley ◽  
Rachel Brunetti ◽  
Lawrence J. Tauzin ◽  
Bo Shuang ◽  
Xiyu Yi ◽  
...  

Author(s):  
Kota Tsujimori ◽  
Jun Hirotani ◽  
Shunta Harada

AbstractThe number of data points of digitally recorded spectra have been limited by the number of multichannel detectors employed, which sometimes impedes the precise characterization of spectral peak shape. Here we describe a methodology to increase the number of data points as well as the signal-to-noise (S/N) ratio by applying Bayesian super-resolution in the analysis of spectroscopic data. In our present method, first, the hyperparameters for the Bayesian super-resolution are determined by a virtual experiment imitating actual experimental data, and the precision of the super-resolution reconstruction is confirmed by the calculation of errors from the ideal values. For validation of the super-resolution reconstruction of spectroscopic data, we applied this method to the analysis of Raman spectra. From 200 Raman spectra of a reference Si substrate with a data interval of about 0.8 cm−1, super-resolution reconstruction with a data interval of 0.01 cm−1 was successfully achieved with the promised precision. From the super-resolution spectrum, the Raman scattering peak of the reference Si substrate was estimated as 520.55 (+0.12, −0.09) cm−1, which is comparable to the precisely determined value reported in previous works. The present methodology can be applied to various kinds of spectroscopic analysis, leading to increased precision in the analysis of spectroscopic data and the ability to detect slight differences in spectral peak positions and shapes.


2021 ◽  
Author(s):  
Shikha Dhiman ◽  
Teodora Andrian ◽  
Beatriz Santiago ◽  
Marrit Tholen ◽  
Yuyang Wang ◽  
...  

The characterization of newly synthesized materials is a cornerstone of all chemistry and nanotechnology laboratories. For this purpose, a wide array of analytical techniques have been standardized and are used...


Sign in / Sign up

Export Citation Format

Share Document