Diagnosis of delay defects using statistical timing models

Proceedings. 21st VLSI Test Symposium, 2003. ◽

10.1109/vtest.2003.1197672 ◽

2003 ◽

Cited By ~ 9

Author(s):

A. Krstic ◽

L.-C. Wang ◽

Kwang-Ting Cheng ◽

Jing-Jia Liou

Keyword(s):

Statistical Timing ◽

Delay Defects ◽

Timing Models

Download Full-text

Microarchitectural-level statistical timing models for near-threshold circuit design

The 20th Asia and South Pacific Design Automation Conference ◽

10.1109/aspdac.2015.7058986 ◽

2015 ◽

Cited By ~ 6

Author(s):

Jun Shiomi ◽

Tohru Ishihara ◽

Hidetoshi Onodera

Keyword(s):

Circuit Design ◽

Threshold Circuit ◽

Statistical Timing ◽

Timing Models ◽

Near Threshold

Download Full-text

Non-Gaussian Statistical Timing models of die-to-die and within-die parameter variations for full chip analysis

2008 Asia and South Pacific Design Automation Conference ◽

10.1109/aspdac.2008.4483961 ◽

2008 ◽

Cited By ~ 5

Author(s):

Katsumi Homma ◽

Izumi Nitta ◽

Toshiyuki Shibuya

Keyword(s):

Parameter Variations ◽

Statistical Timing ◽

Non Gaussian ◽

Timing Models ◽

Chip Analysis

Download Full-text

Delay defect diagnosis based upon statistical timing models - the first step [logic testing]

2003 Design, Automation and Test in Europe Conference and Exhibition ◽

10.1109/date.2003.1253628 ◽

2003 ◽

Cited By ~ 1

Author(s):

A. Krstic ◽

L.-C. Wang ◽

Kwang-Ting Cheng ◽

Jing-Jia Liou ◽

M.S. Abadir

Keyword(s):

Logic Testing ◽

Defect Diagnosis ◽

Statistical Timing ◽

Timing Models

Download Full-text

Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models

10.1109/dac.2003.1219102 ◽

2004 ◽

Cited By ~ 5

Author(s):

A. Krstic ◽

L.-C. Wang ◽

K.-T. Cheng ◽

J.-J. Liou ◽

T.M. Mak

Keyword(s):

Fault Models ◽

Statistical Timing ◽

Delay Defects

Download Full-text

Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models

Proceedings of the 40th conference on Design automation - DAC '03 ◽

10.1145/775832.776001 ◽

2003 ◽

Cited By ~ 2

Author(s):

A. Krstic ◽

L.-C. Wang ◽

K.-T. Cheng ◽

J.-J. Liou ◽

T. M. Mak

Keyword(s):

Fault Models ◽

Statistical Timing ◽

Delay Defects

Download Full-text

Statistical Timing Models for Large Macro Cells and IP Blocks Considering Process Variations

IEEE Transactions on Semiconductor Manufacturing ◽

10.1109/tsm.2008.2011629 ◽

2009 ◽

Vol 22 (1) ◽

pp. 3-11 ◽

Cited By ~ 8

Author(s):

Amit Goel ◽

Sarma Vrudhula ◽

Feroze Taraporevala ◽

Praveen Ghanta

Keyword(s):

Process Variations ◽

Statistical Timing ◽

Ip Blocks ◽

Timing Models

Download Full-text

Delay defect diagnosis based upon statistical timing models - the first step [Award]

Proceedings Design, Automation and Test in Europe Conference and Exhibition ◽

10.1109/date.2004.1270517 ◽

2005 ◽

Author(s):

A. Krstic ◽

Li.-C. Wang ◽

Kwang-Ting Cheng ◽

Jing-Jia Liou ◽

M.S. Abadir

Keyword(s):

Defect Diagnosis ◽

Statistical Timing ◽

Timing Models

Download Full-text

Diagnose Compound Hold Time Faults Caused by Spot Delay Defects at Clock Tree

ISTFA 2011: Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2011p0103 ◽

2011 ◽

Author(s):

Yu Huang ◽

Wu-Tung Cheng ◽

Ting-Pu Tai ◽

Liyang Lai ◽

Ruifeng Guo ◽

...

Keyword(s):

Hold Time ◽

Clock Signal ◽

Clock Tree ◽

Scan Testing ◽

Design Error ◽

Functional Logic ◽

Scan Chains ◽

Delay Defects

Abstract If a signal on clock tree is slower than expected due to either a design error or a manufacturing defect, it may cause complicated fault behaviors during scan-based testing. It makes the diagnosis of such defect especially difficult if the defective clock signal is used for both shift and capture operations during the scan testing, because (1) the defect induces hold time faults on scan chains during shift cycles, and (2) hold-time faults may also be introduced during capture cycles in the functional logic paths. In this paper we illustrate the failure behaviors of such clock defects and propose an algorithm to diagnose it.

Download Full-text