Test data compression and test time reduction of longest-path-per-gate tests based on Illinois scan architecture

2003 ◽  
Author(s):  
M. Sharma ◽  
J.H. Patel ◽  
J. Rearick
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Time ◽  
Test Data Compression ◽  
Test Time Reduction ◽  
Longest Path ◽  
Time Reduction

SoC Test Data Compression Technique Based on RLE-G

2010 ◽  
Vol 439-440 ◽  
pp. 1595-1600
Author(s):  
Chun Jian Deng ◽  
Liu Wei ◽  
Xi Feng Zheng ◽  
Liang Yang
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Time ◽  
Test Data Compression ◽  
Compression Technique ◽  
Current Test ◽  
Soc Test ◽  
Efficient Test ◽  
Data Volume ◽  
Test Vectors

Test data compression has been an effective way to reduce test data volume and test time, as well as to solve automatic test equipment (ATE) memory and bandwidth limitation. We analyze the limitations of current test data compression algorithm and draw on the previous experience to deduce an optimal compression coding model suitable for SoC test data. In addition, in this paper we make full use of the relevance of the test vectors and the advantages of statistical coding to present an efficient test data compression method RLE-G based on the coding model, and give the RLE-G the optimal compression efficiency of the boundary conditions and realization steps. The experimental results for ISCAS 89 benchmark circuits demonstrate RLE-G have the excellent advantages of high compression ratio.

A Test Data Compression Scheme Based on Mixed Fixed and Variable Length Coding

2009 ◽  
Vol 31 (10) ◽  
pp. 1826-1834 ◽  
Author(s):  
Wen-Fa ZHAN ◽  
Hua-Guo LIANG ◽  
Feng SHI ◽  
Zheng-Feng HUANG
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Variable Length ◽  
Test Data Compression ◽  
Compression Scheme ◽  
Variable Length Coding
Sign in / Sign up

Export Citation Format

Share Document