A multi-mode scannable memory element for high test application efficiency and delay testing
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1996 ◽
Vol 54
◽
pp. 730-731
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2009 ◽
Vol E92-B
(12)
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pp. 3717-3725
2014 ◽
Vol E97.C
(7)
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pp. 781-786
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2011 ◽
Vol E94-A
(12)
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pp. 2571-2578
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