Automated test pattern generation for analog integrated circuits

2002 ◽  
Author(s):  
W. Verhaegen ◽  
G. Van der Plas ◽  
G. Gielen
Keyword(s):  
Integrated Circuits ◽  
Test Pattern ◽  
Analog Integrated Circuits ◽  
Pattern Generation ◽  
Test Pattern Generation ◽  
Automated Test

APPLYING QUANTUM SEARCH TO AUTOMATED TEST PATTERN GENERATION FOR VLSI CIRCUITS

2003 ◽  
Vol 01 (01) ◽  
pp. 79-91 ◽  
Author(s):  
AMARDEEP SINGH ◽  
SARBJEET SINGH
Keyword(s):  
Neural Network ◽  
Energy Function ◽  
Digital Circuits ◽  
Test Pattern ◽  
Pattern Generation ◽  
Vlsi Circuits ◽  
Test Pattern Generation ◽  
Quantum Search ◽  
Test Vector ◽  
Automated Test

This paper presents a quantum search algorithm for Automated Test Pattern Generation (ATPG) of VLSI circuits. For given digital circuits, a neural network is created that represents the digital gates with their interconnections as neurons. This neural network is characterized by an energy function E, which is the mathematics representation of neural network. The solution of the energy function gives us the test vector. The test vector is a combination of input values of digital circuits that detects a particular fault. In this paper, specific aspects of quantum theory like superposition and quantum parallelism are applied to find the solution of this energy function. The algorithm developed is so efficient that it requires only [Formula: see text] (where N is the total number of vectors) iterations to find the desired test vector whereas in classical computing, it takes N/2 iterations. At the end, a comparison is made between exhaustive, simulated annealing and quantum based techniques. Experimental results show that the quantum search algorithms are more efficient than classical algorithms and can be applied with more efficiency.

scholarly journals Soft Computing Approach To Automatic Test Pattern Generation For Sequential Vlsi Circuit

2013 ◽  
pp. 42-47
Author(s):  
Monalisa Mohanty ◽  
S. N. Patnaik
Keyword(s):  
Integrated Circuits ◽  
Test Pattern ◽  
Difficult Problem ◽  
Pattern Generation ◽  
Vlsi Circuits ◽  
Test Sequence ◽  
Test Pattern Generation ◽  
Automatic Test Pattern Generation ◽  
Automatic Test ◽  
Sequence Generation

Due to the constant development in the integrated circuits, the automatic test pattern generation problem become more vital for sequential vlsi circuits in these days. Also testing of integrating circuits and systems has become a difficult problem. In this paper we have discussed the problem of the automatic test sequence generation using particle swarm optimization(PSO) and technique for structure optimization of a deterministic test pattern generator using genetic algorithm(GA).

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