Analog Circuit Testing Using Auto Regressive Moving Average Models

20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) ◽

10.1109/vlsid.2007.35 ◽

2007 ◽

Author(s):

Jeffrey Ayres ◽

Michael L. Bushnell

Keyword(s):

Analog Circuit ◽

Moving Average ◽

Circuit Testing ◽

Moving Average Models ◽

Auto Regressive ◽

Analog Circuit Testing

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Forecasting the trend in cases of Ebola virus disease in West African countries using auto regressive integrated moving average models

International Journal of Community Medicine and Public Health ◽

10.18203/2394-6040.ijcmph20160620 ◽

2016 ◽

pp. 615-618 ◽

Cited By ~ 1

Author(s):

Manikandan M. ◽

Velavan A. ◽

Zile Singh ◽

Anil Purty ◽

Joy Bazroy ◽

...

Keyword(s):

Ebola Virus ◽

Virus Disease ◽

Moving Average ◽

West African ◽

Ebola Virus Disease ◽

African Countries ◽

Moving Average Models ◽

Auto Regressive

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Analog circuit testing based on sensitivity computation and new circuit modeling

Proceedings of IEEE International Test Conference - (ITC) ◽

10.1109/test.1993.470638 ◽

2002 ◽

Cited By ~ 47

Author(s):

N.B. Hamida ◽

B. Kaminska

Keyword(s):

Analog Circuit ◽

Circuit Modeling ◽

Circuit Testing ◽

Analog Circuit Testing

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Effect of noise on analog circuit testing

Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) ◽

10.1109/vtest.1998.670861 ◽

2002 ◽

Cited By ~ 3

Author(s):

M.K. Iyer ◽

M.L. Bushnell

Keyword(s):

Analog Circuit ◽

Circuit Testing ◽

Analog Circuit Testing

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Automatic seasonal auto regressive moving average models and unit root test detection

International Journal of Management Science and Engineering Management ◽

10.1080/17509653.2008.10671053 ◽

2008 ◽

Vol 3 (4) ◽

pp. 266-274 ◽

Cited By ~ 2

Author(s):

Siana Halim ◽

Indriati N Bisono

Keyword(s):

Unit Root ◽

Moving Average ◽

Unit Root Test ◽

Moving Average Models ◽

Auto Regressive

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Multiple fault analog circuit testing by sensitivity analysis

Analog Integrated Circuits and Signal Processing ◽

10.1007/bf01239076 ◽

1993 ◽

Vol 4 (3) ◽

pp. 231-243 ◽

Cited By ~ 10

Author(s):

Naim Ben Hamida ◽

Bozena Kaminska

Keyword(s):

Sensitivity Analysis ◽

Analog Circuit ◽

Circuit Testing ◽

Multiple Fault ◽

Analog Circuit Testing

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Forecasting Load Using Continuous-time Fractionally Auto-Regressive Integrated Moving-Average Models with Discrete Data

Science Journal of Applied Mathematics and Statistics ◽

10.11648/j.sjams.20160402.12 ◽

2016 ◽

Vol 4 (2) ◽

pp. 29

Author(s):

Godfred K. Abledu

Keyword(s):

Continuous Time ◽

Moving Average ◽

Discrete Data ◽

Moving Average Models ◽

Auto Regressive

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Short-term traffic-flow forecasting with auto-regressive moving average models

Proceedings of the Institution of Civil Engineers - Transport ◽

10.1680/tran.12.00012 ◽

2014 ◽

Vol 167 (4) ◽

pp. 232-239 ◽

Cited By ~ 4

Author(s):

Tiep Mai ◽

Bidisha Ghosh ◽

Simon Wilson

Keyword(s):

Traffic Flow ◽

Moving Average ◽

Short Term ◽

Traffic Flow Forecasting ◽

Moving Average Models ◽

Auto Regressive

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Auto-Regressive Moving Average Models on Complex-Valued Matrix Lie Groups

Circuits Systems and Signal Processing ◽

10.1007/s00034-014-9745-1 ◽

2014 ◽

Vol 33 (8) ◽

pp. 2449-2473 ◽

Cited By ~ 3

Author(s):

Simone Fiori

Keyword(s):

Lie Groups ◽

Moving Average ◽

Moving Average Models ◽

Auto Regressive ◽

Complex Valued

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Bootstrapping the portmanteau tests in weak auto-regressive moving average models

Journal of the Royal Statistical Society Series B (Statistical Methodology) ◽

10.1111/rssb.12112 ◽

2015 ◽

Vol 78 (2) ◽

pp. 463-485 ◽

Cited By ~ 13

Author(s):

Ke Zhu

Keyword(s):

Moving Average ◽

Moving Average Models ◽

Portmanteau Tests ◽

Auto Regressive

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Multiple fault analog circuit testing by sensitivity analysis

Journal of Electronic Testing ◽

10.1007/bf00972158 ◽

1993 ◽

Vol 4 (4) ◽

pp. 331-343 ◽

Cited By ~ 37

Author(s):

Naim Ben Hamida ◽

Bozena Kaminska

Keyword(s):

Sensitivity Analysis ◽

Analog Circuit ◽

Circuit Testing ◽

Multiple Fault ◽

Analog Circuit Testing

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