Multiple fault analog circuit testing by sensitivity analysis

Naim Ben Hamida; Bozena Kaminska

doi:10.1007/bf01239076

Multiple fault analog circuit testing by sensitivity analysis

Analog Integrated Circuits and Signal Processing ◽

10.1007/bf01239076 ◽

1993 ◽

Vol 4 (3) ◽

pp. 231-243 ◽

Cited By ~ 10

Author(s):

Naim Ben Hamida ◽

Bozena Kaminska

Keyword(s):

Sensitivity Analysis ◽

Analog Circuit ◽

Circuit Testing ◽

Multiple Fault ◽

Analog Circuit Testing

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Multiple fault analog circuit testing by sensitivity analysis

Journal of Electronic Testing ◽

10.1007/bf00972158 ◽

1993 ◽

Vol 4 (4) ◽

pp. 331-343 ◽

Cited By ~ 37

Author(s):

Naim Ben Hamida ◽

Bozena Kaminska

Keyword(s):

Sensitivity Analysis ◽

Analog Circuit ◽

Circuit Testing ◽

Multiple Fault ◽

Analog Circuit Testing

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Analog circuit testing based on sensitivity computation and new circuit modeling

Proceedings of IEEE International Test Conference - (ITC) ◽

10.1109/test.1993.470638 ◽

2002 ◽

Cited By ~ 47

Author(s):

N.B. Hamida ◽

B. Kaminska

Keyword(s):

Analog Circuit ◽

Circuit Modeling ◽

Circuit Testing ◽

Analog Circuit Testing

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Effect of noise on analog circuit testing

Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) ◽

10.1109/vtest.1998.670861 ◽

2002 ◽

Cited By ~ 3

Author(s):

M.K. Iyer ◽

M.L. Bushnell

Keyword(s):

Analog Circuit ◽

Circuit Testing ◽

Analog Circuit Testing

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Frequency-based BIST for analog circuit testing

Proceedings 13th IEEE VLSI Test Symposium ◽

10.1109/vtest.1995.512617 ◽

2002 ◽

Cited By ~ 18

Author(s):

S. Khaled ◽

B. Kaminska ◽

B. Courtois ◽

M. Lubaszewski

Keyword(s):

Analog Circuit ◽

Circuit Testing ◽

Analog Circuit Testing

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Embedded tutorial 3: Statistical learning for analog circuit testing

2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2011.5941406 ◽

2011 ◽

Author(s):

Haralampos-G. Stratigopoulos

Keyword(s):

Statistical Learning ◽

Analog Circuit ◽

Circuit Testing ◽

Analog Circuit Testing

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Look up Table Based Low Power Analog Circuit Testing

International Journal of Engineering ◽

10.5829/idosi.ije.2016.29.09c.10 ◽

2016 ◽

Vol 29 (9) ◽

Keyword(s):

Low Power ◽

Analog Circuit ◽

Circuit Testing ◽

Look Up Table ◽

Analog Circuit Testing

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A Fault Signature Characterization Based Analog Circuit Testing Scheme and the Extension of IEEE 1149.4 Standard

IEICE Transactions on Information and Systems ◽

10.1587/transinf.e93.d.33 ◽

2010 ◽

Vol E93-D (1) ◽

pp. 33-42

Author(s):

Wimol SAN-UM ◽

Masayoshi TACHIBANA

Keyword(s):

Analog Circuit ◽

Circuit Testing ◽

Testing Scheme ◽

Analog Circuit Testing

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On the application of fault detection observers to analog circuit testing

Proceedings ETC 93 Third European Test Conference ◽

10.1109/etc.1993.246525 ◽

2002 ◽

Cited By ~ 1

Author(s):

W. Vermeiren ◽

B. Straube ◽

C. Hohn

Keyword(s):

Fault Detection ◽

Analog Circuit ◽

Circuit Testing ◽

Analog Circuit Testing

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Analog circuit testing

2017 International Mixed Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2017.7995206 ◽

2017 ◽

Author(s):

Alkis A. Hatzopoulos

Keyword(s):

Analog Circuit ◽

Circuit Testing ◽

Analog Circuit Testing

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Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing

Journal of Electronic Testing ◽

10.1007/s10836-012-5305-4 ◽

2012 ◽

Vol 28 (4) ◽

pp. 541-549 ◽

Cited By ~ 4

Author(s):

Suraj Sindia ◽

Vishwani D. Agrawal ◽

Virendra Singh

Keyword(s):

Analog Circuit ◽

Fault Coverage ◽

Defect Level ◽

Circuit Testing ◽

Analog Circuit Testing

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