A Localization Method Based on Infrared Detectors for Surveillance Areas

2006 ◽  
Author(s):  
Barna Cornel ◽  
Stratulat Mircea
Keyword(s):  
Infrared Detectors ◽  
Localization Method

Differentiating Processes in Object Completion Using a Dot Localization Method

2014 ◽  
Author(s):  
Susan Carrigan ◽  
Evan Palmer ◽  
Philip J. Kellman
Keyword(s):  
Localization Method

Process Induced Defects in the Silicon Substrate: Approaches for Successful Failure Analysis

2010 ◽  
Author(s):  
J.G. van Hassel ◽  
Xiao-Mei Zhang
Keyword(s):  
Failure Analysis ◽  
Case Studies ◽  
Silicon Substrate ◽  
Processing Technique ◽  
Electrical Characteristics ◽  
Localization Method ◽  
The Right ◽  
Induced Defects

Abstract Failures induced in the silicon substrate by process marginalities or process mistakes need continuous attention in new as well as established technologies. Several case studies showing implant related defects and dislocations in silicon will be discussed. Depending on the electrical characteristics of the failure the localization method has to be chosen. The emphasis of the discussion will be on the importance of the right choice for further physical de-processing to reveal the defect. This paper focuses on the localization method, the de- processing technique and the use of Wright etch for subsequent TEM preparation.

Comparison of Active and Passive Voltage Contrast for Failure Localization

2007 ◽  
Author(s):  
R. Rosenkranz ◽  
W. Werner
Keyword(s):  
Case Studies ◽  
Optical Beam ◽  
Leakage Currents ◽  
Localization Method ◽  
Voltage Contrast ◽  
Failure Localization

Abstract In many cases of failure localization, passive voltage contrast (PVC) localization method does not work, because it is not possible to charge up conducting structures which supposed to be dark in the SEM and FIB images. The reason for this is leakage currents. In this article, the authors show how they succeeded in overcoming these difficulties by the application of the active voltage contrast (AVC) method as it was described as biased voltage contrast by Campbell and Soden. They identified three main cases where the PVC didn't work but where they succeeded in failure localization with the AVC method. This is illustrated with the use of two case studies. Compared to the optical beam based methods the resolution is much better so a single failing contact of e.g. 70 nm technology can clearly be identified which cannot be done by TIVA or OBIRCH.

WSN Localization Method Using Interval Data Clustering

2012 ◽  
Vol 38 (7) ◽  
pp. 1190 ◽  
Author(s):  
Yu PENG ◽  
Qing-Hua LUO ◽  
Dan WANG ◽  
Xi-Yuan PENG
Keyword(s):  
Data Clustering ◽  
Interval Data ◽  
Localization Method

A Robust Self-Localization Method Based on Omnidirectional Vision for Soccer Robots

ROBOT ◽  
2010 ◽  
Vol 32 (4) ◽  
pp. 553-559
Author(s):  
Huimin LU ◽  
Hui ZHANG ◽  
Shaowu YANG ◽  
Zhiqiang ZHENG
Keyword(s):  
Omnidirectional Vision ◽  
Localization Method ◽  
Soccer Robots
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