Electron backscatter diffraction as a domain analysis technique in BiFeO3-PbTiO3 single crystals

2008 ◽  
Vol 55 (5) ◽  
pp. 957-962 ◽  
Author(s):  
T.L. Burnett ◽  
T.P. Comyn ◽  
E. Merson ◽  
A.J. Bell ◽  
K. Mingard ◽  
...  
Keyword(s):  
Single Crystals ◽  
Electron Backscatter Diffraction ◽  
Domain Analysis ◽  
Analysis Technique ◽  
Electron Backscatter ◽  
Backscatter Diffraction

scholarly journals Twinning Behaviour of Textured Polycrystalline Ni-Mn-Ga Alloy after Hot Extrusion

2009 ◽  
Vol 635 ◽  
pp. 195-199 ◽  
Author(s):  
Robert Chulist ◽  
Andrea Böhm ◽  
Thomas Lippmann ◽  
Werner Skrotzki ◽  
Welf Guntram Drossel ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Single Crystals ◽  
Electron Backscatter Diffraction ◽  
Extrusion Direction ◽  
Hot Extrusion ◽  
High Energy ◽  
Fibre Texture ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Martensitic Variants

Up to now most of the research on Ni-Mn-Ga alloys was concentrated on single crystals. However, there is a great interest in polycrystals for technical applications. Recently, polycrystalline Ni50Mn29Ga21 rods of 25 mm diameter and 400 mm length were prepared by hot extrusion. The <100> <110> double fibre texture of the extruded rods was measured with high-energy synchrotron radiation. The microstructure after hot extrusion was analyzed with electron backscatter diffraction. Within the recrystallized grains all three martensitic variants have developed during cooling. Variants with twin boundaries preferentially aligned along the extrusion direction predominate.

Electron backscatter diffraction analysis of Pb(Mg1/3Nb2/3)O3–35mol%PbTiO3 single crystals grown by seeded polycrystal conversion

2001 ◽  
Vol 16 (3) ◽  
pp. 694-700 ◽  
Author(s):  
Ajmal Khan ◽  
Derrick T. Carpenter ◽  
Adam M. Scotch ◽  
Helen M. Chan ◽  
Martin P. Harmer
Keyword(s):  
Single Crystal ◽  
Single Crystals ◽  
Electron Backscatter Diffraction ◽  
Second Phase ◽  
Crystal Imperfections ◽  
Simple Boundary ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Crystal Seed ◽  
Grown Single Crystal

Electron backscatter diffraction (EBSD) has been applied to characterize Pb(Mg1/3Nb2/3)O3–35 mol%PbTiO3 single crystals grown by the seeded polycrystal conversion method. Macroscopically triangular crystal growth fronts were shown to each be associated with discrete crystals that originated from slightly misoriented segments of an initially cracked single-crystal seed plate. Various types of crystal imperfections, including voids, second-phase regions, and polycrystalline matrix grains trapped within the grown region, were readily identified and distinguished from one another using EBSD. Further, it was shown that trapped matrix grains in the grown region had consistently small misorientations with respect to the grown single crystal and this may be qualitatively explained by a simple boundary energetics argument. The significance of the trapped grains is discussed.

Cross Section Analysis of Cu Filled TSVs Based on High Throughput Plasma-FIB Milling

2012 ◽  
Author(s):  
Frank Altmann ◽  
Jens Beyersdorfer ◽  
Jan Schischka ◽  
Michael Krause ◽  
German Franz ◽  
...  
Keyword(s):  
High Resolution ◽  
Cross Section ◽  
High Throughput ◽  
Cross Sections ◽  
Electron Backscatter Diffraction ◽  
Grain Structure ◽  
Electron Backscatter ◽  
Section Surface ◽  
Backscatter Diffraction ◽  
Section Analysis

Abstract In this paper the new Vion™ Plasma-FIB system, developed by FEI, is evaluated for cross sectioning of Cu filled Through Silicon Via (TSV) interconnects. The aim of the study presented in this paper is to evaluate and optimise different Plasma-FIB (P-FIB) milling strategies in terms of performance and cross section surface quality. The sufficient preservation of microstructures within cross sections is crucial for subsequent Electron Backscatter Diffraction (EBSD) grain structure analyses and a high resolution interface characterisation by TEM.

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