Methodology for feedback variable selection for control of semiconductor manufacturing processes-part 2: application to reactive ion etching

2003 ◽  
Vol 16 (4) ◽  
pp. 588-597 ◽  
Author(s):  
O.D. Patterson ◽  
Xiaobin Dong ◽  
P.P. Khargonekar ◽  
V.N. Nair ◽  
D.S. Grimard
1986 ◽  
Vol 68 ◽  
Author(s):  
Clarence J. Tracy

AbstractThe implementation of plasma deposition and reactive ion etching into a semiconductor VLSI manufacturing process is rarely trivial.In some cases isolated process modules may appear to function well until integrated into a lengthy product flow, where interactions occur with prior or subsequent processing steps.In addition, dry processes have some unique and sometimes undesirable characteristics which need to be considered.Examples of both of these kinds of problems will be shown.Opportunities still exist for research to lead to a better understanding of mechanisms and for development work to improve the equipment and specific processes.


Author(s):  
M. Elta ◽  
H. Etemad ◽  
J. S. Freudenberg ◽  
M. D. Giles ◽  
J. W. Grizzle ◽  
...  

1996 ◽  
Author(s):  
George F. McLane ◽  
Paul Cooke ◽  
Robert P. Moerkirk

2020 ◽  
Vol 54 (6) ◽  
pp. 672-676
Author(s):  
L. K. Markov ◽  
I. P. Smirnova ◽  
M. V. Kukushkin ◽  
A. S. Pavluchenko

1988 ◽  
Vol 24 (13) ◽  
pp. 798 ◽  
Author(s):  
T. Matsui ◽  
H. Sugimoto ◽  
T. Ohishi ◽  
H. Ogata

1989 ◽  
Vol 25 (15) ◽  
pp. 954 ◽  
Author(s):  
T. Matsui ◽  
H. Sugimoto ◽  
K. Ohtsuka ◽  
Y. Abe ◽  
H. Ogata

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